Wojciech. Maly
Wojciech. Maly
Verified email at ece.cmu.edu
Title
Cited by
Cited by
Year
Introduction to stochastic processes in biostatistics
CL Chiang
2698*1968
Inductive fault analysis of MOS integrated circuits
JP Shen, W Maly, FJ Ferguson
IEEE Design & Test of Computers 2 (6), 13-26, 1985
6071985
Realistic fault modeling for VLSI testing
W Maly
24th ACM/IEEE Design Automation Conference, 173-180, 1987
2911987
CMOS bridging fault detection
TM Storey, W Maly
Proceedings. International Test Conference 1990, 842-851, 1990
2501990
Test generation for current testing (CMOS ICs)
P Nigh, W Maly
IEEE Design & Test of Computers 7 (1), 26-38, 1990
2431990
Modeling of lithography related yield losses for CAD of VLSI circuits
W Maly
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1985
2411985
Built-in current testing-feasibility study
W Maly, P Nigh
1988 IEEE International Conference on Computer-Aided Design, 340,341,342,343 …, 1988
2361988
Iddq test: Sensitivity analysis of scaling
TW Williams, RH Dennard, R Kapur, MR Mercer, M Maly
Proceedings International Test Conference 1996. Test and Design Validity …, 1996
1941996
Computer-aided design for VLSI circuit manufacturability
W Maly
Proceedings of the IEEE 78 (2), 356-392, 1990
1911990
VLSI yield prediction and estimation: A unified framework
W Maly, AJ Strojwas, SW Director
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1986
1841986
Yield estimation model for VLSI artwork evaluation
W Maly, J Deszczka
Electronics Letters 19 (6), 226-227, 1983
1801983
Testing oriented analysis of CMOS ICs with opens
W Maly, PK Nag, P Nigh
[1988] IEEE International Conference on Computer-Aided Design (ICCAD-89 …, 1988
1771988
Current signatures [VLSI circuit testing]
AE Gattiker, W Maly
Proceedings of 14th VLSI Test Symposium, 112-117, 1996
1741996
Stacked 3-dimensional 6T SRAM cell with independent double gate transistors
M Weis, A Pfitzner, D Kasprowicz, R Emling, T Fischer, S Henzler, W Maly, ...
2009 IEEE International Conference on IC Design and Technology, 169-172, 2009
1682009
Interconnect characteristics of 2.5-D system integration scheme
Y Deng, WP Maly
Proceedings of the 2001 international symposium on Physical design, 171-175, 2001
1622001
Current signatures: application
AE Gattiker, W Maly
Proceedings International Test Conference 1997, 156-165, 1997
1581997
Systematic characterization of physical defects for fault analysis of MOS IC cells
W Maly, FJ Ferguson, JP Shen
Proceedings of the 1984 international test conference on The three faces of …, 1984
1461984
Integrated circuit device, system, and method of fabrication
WP Maly
US Patent App. 12/300,753, 2009
1452009
Fault modeling for the testing of mixed integrated circuits
A Meixner, W Maly
1991, Proceedings. International Test Conference, 564, 1991
1341991
Built-in current testing
W Maly, M Patyra
IEEE Journal of Solid-State Circuits 27 (3), 425-428, 1992
1211992
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