| The time domain Green's function and propagator for Maxwell's equations R Nevels, J Jeong IEEE transactions on antennas and propagation 52 (11), 3012-3018, 2004 | 44 | 2004 |
| Time-domain analysis of a lossy nonuniform transmission line J Jeong, R Nevels IEEE Transactions on Circuits and Systems II: Express Briefs 56 (2), 157-161, 2009 | 32 | 2009 |
| Time domain coupled field dyadic Green function solution for Maxwell's equations R Nevels, J Jeong IEEE transactions on antennas and propagation 56 (8), 2761-2764, 2008 | 11 | 2008 |
| Corrections to``The Time Domain Green's Function and Propagator for Maxwell's Equations'' R Nevels, J Jeong IEEE Transactions on Antennas and Propagation 56 (4), 1212-1213, 2008 | 11 | 2008 |
| The time domain propagator method for lossless multiconductor quasi-TEM lines J Jeong, IP Hong, R Nevels IEEE transactions on advanced packaging 32 (3), 619-626, 2009 | 9 | 2009 |
| Microwave simulation of Grover's quantum search algorithm R Nevels, J Jeong, P Hemmer IEEE Antennas and Propagation Magazine 48 (5), 38-47, 2006 | 8 | 2006 |
| Novel time domain analysis technique for lossy nonuniform transmission lines J Jeong, R Nevels 2005 IEEE Antennas and Propagation Society International Symposium 3, 848-851, 2005 | 6 | 2005 |
| Automatic modeling of logic device performance based on machine learning and explainable AI S Kim, K Lee, HK Noh, Y Shin, KB Chang, J Jeong, S Baek, M Kang, ... 2020 International Conference on Simulation of Semiconductor Processes and …, 2020 | 5 | 2020 |
| IEEE Trans. on Antennas and Propag. R Nevels, J Jeong IEEE Trans, on Antennas and Propag 52, 3012-3018, 2004 | 5 | 2004 |
| A simulation physics-guided neural network for predicting semiconductor structure with few experimental data QH Kim, S Lee, A Ma, J Kim, HK Noh, KB Chang, W Cheon, S Yi, J Jeong, ... Solid-State Electronics 201, 108568, 2023 | 4 | 2023 |
| Improvement of on-cell metrology using spectral imaging with TCAD modeling B Ahn, K Lee, J Yang, J Doh, J Jeong, T Kwag, M Kim, Y Kim, J Kim, ... Solid-State Electronics 201, 108578, 2023 | 2 | 2023 |
| Sensitivity enhancement in OCD metrology by optimizing azimuth angle based on the RCWA simulation H Choi, K Lee, J Doh, J Jeong, T Kwag, M Kim, Y Kim, J Kim, HK Yoo, ... Solid-State Electronics 200, 108574, 2023 | 2 | 2023 |
| Automated simulation method based on database in semiconductor design process, automated simulation generation device and semiconductor design automation system performing the … S Han, J Doh, J Park, Y Lee, H Lee, J Jeong US Patent App. 18/453,808, 2024 | | 2024 |
| E-beam simulation for advanced SEM applications in semiconductor industry W Cheon, T Moon, I Kwon, J Lee, J Lee, Y Kwon, A Ramu, S Jin, ... Metrology, Inspection, and Process Control XXXVIII 12955, 381-387, 2024 | | 2024 |
| A few-shot machine learning-based OCD metrology algorithm with anomaly detection and wafer-level data augmentation M Kim, QH Kim, KB Chang, J Jeong, S Lee, S Mo, D Kang, J Park, YS Kim, ... Metrology, Inspection, and Process Control XXXVIII 12955, 189-196, 2024 | | 2024 |
| Mixup-based Neural Network for Image Restoration and Structure Prediction from SEM Images J Park, Y Cho, Y Hwang, A Ma, QH Kim, K Chang, J Jeong, SJ Kang IEEE Transactions on Instrumentation and Measurement, 2024 | | 2024 |
| Method and system for measuring structure based on spectrum KIM QHwan, J Kim, H Noh, MA Ami, S Lee, K Chang, W Cheon, J Jeong US Patent App. 18/348,469, 2024 | | 2024 |
| A New Anisotropic Driving Force Model for SiC Device Simulations S Jin, K Lee, W Choi, C Park, S Yi, H Fujii, J Yoo, Y Park, J Jeong, DS Kim IEEE Transactions on Electron Devices, 2024 | | 2024 |
| Method of generating device structure prediction model and device structure simulation apparatus MA Ami, H Noh, S Yi, D Ihm, K Chang, J Jeong US Patent App. 17/890,557, 2023 | | 2023 |
| Small angle x-ray scattering (SAXS) and Q-space weighting filter for× 3 CD-extraction accuracy improvement Y Tsuji, D Kim, G Yoo, BH Hwang, K Kim, D Lee, Y Sasai, S Yi, J Jeong, ... AIP Advances 11 (6), 2021 | | 2021 |
