Aku Seppänen
Title
Cited by
Cited by
Year
Electrical resistance tomography imaging of concrete
K Karhunen, A Seppänen, A Lehikoinen, PJM Monteiro, JP Kaipio
Cement and Concrete Research 40 (1), 137-145, 2010
2192010
State estimation with fluid dynamical evolution models in process tomography-an application to impedance tomography
A Seppänen, M Vauhkonen, PJ Vauhkonen, E Somersalo, JP Kaipio
Inverse Problems 17 (3), 467, 2001
1352001
Electrical impedance tomography-based sensing skin for quantitative imaging of damage in concrete
M Hallaji, A Seppänen, M Pour-Ghaz
Smart Materials and Structures 23 (8), 085001, 2014
1272014
Sparsity reconstruction in electrical impedance tomography: an experimental evaluation
M Gehre, T Kluth, A Lipponen, B Jin, A Seppänen, JP Kaipio, P Maass
Journal of Computational and Applied Mathematics 236 (8), 2126-2136, 2012
902012
Electrical resistance tomography to monitor unsaturated moisture flow in cementitious materials
M Hallaji, A Seppänen, M Pour-Ghaz
Cement and Concrete Research 69, 10-18, 2015
692015
Electrical Resistance Tomography for Assessment of Cracks in Concrete.
K Karhunen, A Seppänen, A Lehikoinen, J Blunt, JP Kaipio, PJM Monteiro
ACI Materials Journal 107 (5), 2010
612010
Bayesian approach to tree detection based on airborne laser scanning data
T Lahivaara, A Seppanen, JP Kaipio, J Vauhkonen, L Korhonen, T Tokola, ...
IEEE transactions on geoscience and remote sensing 52 (5), 2690-2699, 2013
522013
Can electrical resistance tomography be used for imaging unsaturated moisture flow in cement-based materials with discrete cracks?
D Smyl, R Rashetnia, A Seppänen, M Pour-Ghaz
Cement and Concrete Research 91, 61-72, 2017
492017
Posterior covariance related optimal current patterns in electrical impedance tomography
JP Kaipio, A Seppänen, E Somersalo, H Haario
Inverse Problems 20 (3), 919, 2004
492004
State space models in process tomography—approximation of state noise covariance
A Seppänen, M Vauhkonen, E Somersalo, JP Kaipio
Inverse Problems in Engineering 9 (5), 561-585, 2001
492001
Estimation of conductivity changes in a region of interest with electrical impedance tomography
D Liu, V Kolehmainen, S Siltanen, A Seppanen
arXiv preprint arXiv:1403.6587, 2014
462014
Simultaneous reconstruction of outer boundary shape and admittivity distribution in electrical impedance tomography
J Dardé, N Hyvönen, A Seppänen, S Staboulis
SIAM Journal on Imaging Sciences 6 (1), 176-198, 2013
422013
A nonlinear approach to difference imaging in EIT; assessment of the robustness in the presence of modelling errors
D Liu, V Kolehmainen, S Siltanen, A Seppänen
Inverse Problems 31 (3), 035012, 2015
412015
Simultaneous recovery of admittivity and body shape in electrical impedance tomography: an experimental evaluation
J Dardé, N Hyvönen, A Seppänen, S Staboulis
Inverse Problems 29 (8), 085004, 2013
412013
Nonlinear difference imaging approach to three-dimensional electrical impedance tomography in the presence of geometric modeling errors
D Liu, V Kolehmainen, S Siltanen, AM Laukkanen, A Seppänen
IEEE Transactions on Biomedical Engineering 63 (9), 1956-1965, 2015
382015
Electrical impedance tomography imaging with reduced-order model based on proper orthogonal decomposition
A Lipponen, A Seppanen, JP Kaipio
Journal of Electronic Imaging 22 (2), 023008, 2013
362013
Experimental evaluation of 3D electrical impedance tomography with total variation prior
G González, JMJ Huttunen, V Kolehmainen, A Seppänen, M Vauhkonen
Inverse Problems in Science and Engineering 24 (8), 1411-1431, 2016
342016
Electrical resistance tomography imaging of concrete
A Seppänen, K Karhunen, A Lehikoinen, JP Kaipio, PJM Monteiro
Concrete Repair, Rehabilitation and Retrofitting II: 2nd International …, 2009
332009
Using process tomography as a sensor for optimal control
AR Ruuskanen, A Seppänen, S Duncan, E Somersalo, JP Kaipio
Applied numerical mathematics 56 (1), 37-54, 2006
332006
Fluid dynamical models and state estimation in process tomography: Effect due to inaccuracies in flow fields
A Seppanen, M Vauhkonen, E Somersalo, JP Kaipio
Journal of Electronic Imaging 10 (3), 630-640, 2001
332001
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