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John E. Greivenkamp
John E. Greivenkamp
Professor of Optical Sciences, University of Arizona
Verified email at arizona.edu
Title
Cited by
Cited by
Year
14. Phase shifting interferometry
JE Greivenkamp
Optical shop testing, 1991
6261991
Field guide to geometrical optics
JE Greivenkamp
SPIE, 2004
5782004
Generalized data reduction for heterodyne interferometry
JE Greivenkamp
Optical Engineering 23 (4), 350-352, 1984
5121984
Representation of videokeratoscopic height data with Zernike polynomials
J Schwiegerling, JE Greivenkamp, JM Miller
JOSA A 12 (10), 2105-2113, 1995
2281995
Sub-nyquist interferometry
JE Greivenkamp
Applied optics 26 (24), 5245-5258, 1987
2141987
Using corneal height maps and polynomial decomposition to determine corneal aberrations
J Schwiegerling, JE Greivenkamp
Optometry and Vision Science 74 (11), 906-916, 1997
1351997
Visual acuity modeling using optical raytracing of schematic eyes
JE Greivenkamp, J Schwiegerling, JM Miller, MD Mellinger
American journal of ophthalmology 120 (2), 227-240, 1995
1341995
Keratoconus detection based on videokeratoscopic height data
J Schwiegerling, JE Greivenkamp
Optometry and vision science 73 (12), 721-728, 1996
1221996
Color dependent optical prefilter for the suppression of aliasing artifacts
JE Greivenkamp
Applied Optics 29 (5), 676-684, 1990
1201990
Extended-range moire contouring
JE Greivenkamp Jr
US Patent 4,794,550, 1988
1131988
Sub-nyquist interferometry
JE Greivenkamp Jr
US Patent 4,791,584, 1988
1071988
Adsorption of γ‐aminopropyltriethoxysilane onto bulk iron from aqueous solutions
FJ Boerio, LH Schoenlein, JE Greivenkamp
Journal of Applied Polymer Science 22 (1), 203-213, 1978
1071978
Optical spatial frequency filter
JE Greivenkamp Jr
US Patent 4,575,193, 1986
931986
Lateral-shift variable aberration generators
IA Palusinski, JM Sasian, JE Greivenkamp
Applied optics 38 (1), 86-90, 1999
821999
System for scanning halftoned images
JE Greivenkamp Jr
US Patent 4,987,496, 1991
821991
Optical shop testing
JE Greivenkamp, JH Bruning, D Malacara
Chapter 4, 501-598, 1992
771992
Method and apparatus for absolute Moire distance measurements using a grating printed on or attached to a surface
JE Greivenkamp Jr, RJ Palum, KG Sullivan
US Patent 5,075,562, 1991
761991
Design of a nonnull interferometer for aspheric wave fronts
JE Greivenkamp, RO Gappinger
Applied optics 43 (27), 5143-5151, 2004
712004
Iterative reverse optimization procedure for calibration of aspheric wave-front measurements on a nonnull interferometer
RO Gappinger, JE Greivenkamp
Applied optics 43 (27), 5152-5161, 2004
672004
Modulation transfer function measurement of sparse-array sensors using a self-calibrating fringe pattern
JE Greivenkamp, AE Lowman
Applied optics 33 (22), 5029-5036, 1994
501994
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