14. Phase shifting interferometry JE Greivenkamp Optical shop testing, 1991 | 626 | 1991 |
Field guide to geometrical optics JE Greivenkamp SPIE, 2004 | 578 | 2004 |
Generalized data reduction for heterodyne interferometry JE Greivenkamp Optical Engineering 23 (4), 350-352, 1984 | 512 | 1984 |
Representation of videokeratoscopic height data with Zernike polynomials J Schwiegerling, JE Greivenkamp, JM Miller JOSA A 12 (10), 2105-2113, 1995 | 228 | 1995 |
Sub-nyquist interferometry JE Greivenkamp Applied optics 26 (24), 5245-5258, 1987 | 214 | 1987 |
Using corneal height maps and polynomial decomposition to determine corneal aberrations J Schwiegerling, JE Greivenkamp Optometry and Vision Science 74 (11), 906-916, 1997 | 135 | 1997 |
Visual acuity modeling using optical raytracing of schematic eyes JE Greivenkamp, J Schwiegerling, JM Miller, MD Mellinger American journal of ophthalmology 120 (2), 227-240, 1995 | 134 | 1995 |
Keratoconus detection based on videokeratoscopic height data J Schwiegerling, JE Greivenkamp Optometry and vision science 73 (12), 721-728, 1996 | 122 | 1996 |
Color dependent optical prefilter for the suppression of aliasing artifacts JE Greivenkamp Applied Optics 29 (5), 676-684, 1990 | 120 | 1990 |
Extended-range moire contouring JE Greivenkamp Jr US Patent 4,794,550, 1988 | 113 | 1988 |
Sub-nyquist interferometry JE Greivenkamp Jr US Patent 4,791,584, 1988 | 107 | 1988 |
Adsorption of γ‐aminopropyltriethoxysilane onto bulk iron from aqueous solutions FJ Boerio, LH Schoenlein, JE Greivenkamp Journal of Applied Polymer Science 22 (1), 203-213, 1978 | 107 | 1978 |
Optical spatial frequency filter JE Greivenkamp Jr US Patent 4,575,193, 1986 | 93 | 1986 |
Lateral-shift variable aberration generators IA Palusinski, JM Sasian, JE Greivenkamp Applied optics 38 (1), 86-90, 1999 | 82 | 1999 |
System for scanning halftoned images JE Greivenkamp Jr US Patent 4,987,496, 1991 | 82 | 1991 |
Optical shop testing JE Greivenkamp, JH Bruning, D Malacara Chapter 4, 501-598, 1992 | 77 | 1992 |
Method and apparatus for absolute Moire distance measurements using a grating printed on or attached to a surface JE Greivenkamp Jr, RJ Palum, KG Sullivan US Patent 5,075,562, 1991 | 76 | 1991 |
Design of a nonnull interferometer for aspheric wave fronts JE Greivenkamp, RO Gappinger Applied optics 43 (27), 5143-5151, 2004 | 71 | 2004 |
Iterative reverse optimization procedure for calibration of aspheric wave-front measurements on a nonnull interferometer RO Gappinger, JE Greivenkamp Applied optics 43 (27), 5152-5161, 2004 | 67 | 2004 |
Modulation transfer function measurement of sparse-array sensors using a self-calibrating fringe pattern JE Greivenkamp, AE Lowman Applied optics 33 (22), 5029-5036, 1994 | 50 | 1994 |