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Co-authors
- Felix Meliformer head of length, nano- and microtechnologyVerified email at metas.ch
- Diego F GroszGrupo de Comunicaciones Ópticas, Depto. de Ing. en Telecomunicaciones, Centro Atómico BarilocheVerified email at ib.edu.ar
- Anjali AgarwalLGS InnovationsVerified email at caci.com
- Rudolf ThalmannHead of sector, Federal Institute of Metrology METASVerified email at metas.ch
- Luc ThévenazProfessor at EPFL Ecole Polytechnique Fédérale de Lausanne, School of Engineering, Institute ofVerified email at epfl.ch
- Juerg LeutholdInstitute of Electromagnetic Fields (IEF), ETH Zurich, Zurich, SwitzerlandVerified email at ethz.ch
- Sethumadhavan ChandrasekharRetired Nokia Bell LabsVerified email at ieee.org
- Xiang LiuHuawei TechnologiesVerified email at ieee.org
- Chris XuIBM Chair Professor of Applied and Engineering Physics, Cornell UniversityVerified email at cornell.edu
- Christopher DoerrAcacia CommunicationsVerified email at acacia-inc.com
- A.M. IonescuProfessor of NanoelectronicsVerified email at epfl.ch