Follow
Juan Soto
Juan Soto
Senior Computer Scientist / Academic Director, TU Berlin
Verified email at tu-berlin.de - Homepage
Title
Cited by
Cited by
Year
A statistical test suite for random and pseudorandom number generators for cryptographic applications
A Rukhin, J Soto, J Nechvatal, M Smid, E Barker, S Leigh, M Levenson, ...
US Department of Commerce, Technology Administration, National Institute of …, 2001
41672001
A statistical test suite for random and pseudorandom number generators for cryptographic applications
LE Bassham, AL Rukhin, J Soto, JR Nechvatal, ME Smid, SD Leigh, ...
Lawrence E. Bassham, Andrew L. Rukhin, Juan Soto, James R. Nechvatal, Miles …, 2010
6852010
Sp 800-22 rev. 1a. a statistical test suite for random and pseudorandom number generators for cryptographic applications
LE Bassham III, AL Rukhin, J Soto, JR Nechvatal, ME Smid, EB Barker, ...
National Institute of Standards & Technology, 2010
556*2010
Statistical testing of random number generators
J Soto
Proceedings of the 22nd national information systems security conference 10 …, 1999
3081999
Randomness testing of the advanced encryption standard finalist candidates
J Soto, LE Bassham
US Department of Commerce, Technology Administration, National Institute of …, 2000
2032000
Randomness testing of the advanced encryption standard candidate algorithms
J Soto
US Department of Commerce, Technology Administration, National Institute of …, 1999
170*1999
A survey of state management in big data processing systems
QC To, J Soto, V Markl
The VLDB Journal 27 (6), 847-872, 2018
1002018
NIST special publication 800-22 revision 1a: A statistical test suite for random and pseudorandom number generators for cryptographic applications
A Rukhin, J Soto, J Nechvatal, M Smid, E Barker, S Leigh, M Levenson, ...
NIST, US Department of Commerce, USA, 2010
63*2010
Nist special publication 800-22: A statistical test suite for the validation of random number generators and pseudo random number generators for cryptographic applications
A Rukhin, J Soto, J Nechvatal, M Smid, E Barker, S Leigh, M Levenson, ...
NIST Special Publication 800 (22), 2010
58*2010
800-22rev1a
SP NIST
A Statistical Test Suite for the Validation of Random Number Generators and …, 2010
38*2010
Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications NIST Special Publication, Gaithersburg, MD
AA Rukhin, J Soto, J Nechvatal, M Smid, E Barker
vol 1, 1-10, 2001
33*2001
A statistical test suite for random and pseudorandom number generators for cryptographic applications
A Heckert, J Dray, S Vo, A Rukhin, J Soto, J Nechvatal, M Smid, E Barker, ...
Special Publication (NIST SP), 800-22, 0
31*
A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications. National Institute of Standards and Technology, Special Publication 800 …
A Rukhin, J Soto, J Nechvatal, M Smid, E Barker, S Leigh, M Levenson, ...
NIST special publication, 800-22, 2008
292008
A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications. Booz-Allen and Hamilton Inc.; Mclean, VA
A Rukhin, J Soto, J Nechvatal, M Smid, E Barker
Mclean Va: McLean, VA, USA, 2001
272001
Large-scale data stream processing systems
P Carbone, GE Gévay, G Hermann, A Katsifodimos, J Soto, V Markl, ...
Handbook of big data technologies, 219-260, 2017
262017
Efficient Sample Generation for Scalable Meta Learning
S Schelter, J Soto, V Markl, D Burdick, B Reinwald, A Evfimievski
IEEE International Conference on Data Engineering (ICDE) 2015, 2015
222015
NIST Special Publication 800-22: A Statistical Test Suite for Random and Pseudo Random Number Generators for Cryptographic Applications. National Institute of Standards and …
A Rukhin, J Soto, J Nechvatal, M Smid, E Barker, S Leigh, M Levenson, ...
NIST (April 2010), 2010
222010
A statistical test suite for random and pseudorandom number generators for cryptographic applications, NIST
A Rukhin, J Soto, J Nechvatal, M Smid, E Barker, S Leigh, M Levenson, ...
Special, Publication, 800-22, 2001
212001
A Statistical Test Suite for Random and Psuedorandom Number Generators for Cryptographic Application NIST SP 800-22
AL Rukhin, J Soto, JR Nechvatal, M Smid, EB Barker, S Leigh, ...
US Government Printing Office, Washington, 2000
212000
On fault tolerance for distributed iterative dataflow processing
C Xu, M Holzemer, M Kaul, J Soto, V Markl
IEEE Transactions on Knowledge and Data Engineering 29 (8), 1709-1722, 2017
202017
The system can't perform the operation now. Try again later.
Articles 1–20