Optical probing (EOFM/TRI): a large set of complementary applications for ultimate VLSI P Perdu, G Bascoul, S Chef, G Celi, K Sanchez Proceedings of the 20th IEEE International Symposium on the Physical and …, 2013 | 22 | 2013 |
Frequency mapping in dynamic light emission with wavelet transform S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak Microelectronics Reliability 53 (9-11), 1387-1392, 2013 | 9 | 2013 |
Descrambling of embedded SRAM using a laser probe S Chef, CT Chua, JY Tay, YW Siah, S Bhasin, J Breier, CL Gan 2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018 | 8 | 2018 |
Filtering and emission area identification in the Time Resolved Imaging data S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak Proceedings of the 38th International Symposium for Testing and Failure …, 2012 | 8 | 2012 |
Extensive laser fault injection profiling of 65 nm FPGA J Breier, W He, S Bhasin, D Jap, S Chef, HG Ong, CL Gan Journal of Hardware and Systems Security 1, 237-251, 2017 | 7 | 2017 |
Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak Journal of Electronic Imaging 24 (1), 013019-013019, 2015 | 7 | 2015 |
New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI S Chef, P Perdu, G Bascoul, S Jacquir, K Sanchez, S Binczak Proceedings of the 20th IEEE International Symposium on the Physical and …, 2013 | 7 | 2013 |
VLSI for Space Applications—Single Event Effect Investigation and Optical Analysis on an Integrated Laser Platform S Chef, CT Chua, YW Siah, P Perdu, CL Gan, SH Tan, LS Koh ISTFA 2017, 621-630, 2017 | 6 | 2017 |
Quantitative study of photoelectric laser stimulation for logic state imaging in embedded SRAM S Chef, CT Chua, JY Tay, CL Gan ISTFA 2021, 154-162, 2021 | 5 | 2021 |
Unsupervised learning for signal mapping in dynamic photon emission S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak, CL Gan Microelectronics Reliability 55 (9-10), 1564-1568, 2015 | 5 | 2015 |
Automatic emission spots identification in static and dynamic imaging by research of local maxima A Boscaro, S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak ISTFA 2014, 322-326, 2014 | 4 | 2014 |
Cluster matching in time resolved imaging for VLSI analysis S Chef, S Jacquir, P Perdu, K Sanchez, S Binczak Proceedings of the 21th International Symposium on the Physical and Failure …, 2014 | 4 | 2014 |
Pattern image enhancement by extended depth of field S Chef, B Billiot, S Jacquir, K Sanchez, P Perdu, S Binczak Microelectronics Reliability 54 (9-10), 2099-2104, 2014 | 3 | 2014 |
Integrating pulsed laser for a galvo mirror based SEE scanning microscope with optical failure analysis capabilities CT Chua, S Chef, K Sanchez, G Bascoul, P Perdu, SH Tan, CL Gan 2018 International Conference on Radiation Effects of Electronic Devices …, 2018 | 2 | 2018 |
Spatial correction in dynamic photon emission by affine transformation matrix estimation S Chef, S Jacquir, P Perdu, K Sanchez, S Binczak Proceedings of the 21th International Symposium on the Physical and Failure …, 2014 | 2 | 2014 |
Investigation on Data Retrieval in Emerging Non-Volatile Memory Devices Using Conductive Probe Atomic Force Microscopy JY Tay, J Cheah, S Chef, XM Zeng, Q Liu, CL Gan 2023 IEEE International Symposium on the Physical and Failure Analysis of …, 2023 | | 2023 |
Security Evaluation of Microcontrollers: A Case Study in Smart Watches X Zeng, Q Liu, CT Chua, S Chef, CL Gan 2023 IEEE International Symposium on the Physical and Failure Analysis of …, 2023 | | 2023 |
Embedded-EEPROM descrambling via laser-based techniques–A case study on AVR MCU S Chef, CC Tah, JY Tay, J Cheah, CL Gan 2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), 1-8, 2022 | | 2022 |
Machine Learning for Time-Resolved Emission: Image Resolution Enhancement S Chef, CT Chua, CL Gan EDFA Technical Articles 23 (3), 24-31, 2021 | | 2021 |
A study of clustering for the enhancement of image resolution in dynamic photon emission S Chef, CT Chua, CL Gan ISTFA 2019, 68-78, 2019 | | 2019 |