Seuraa
Thomas Philippe
Thomas Philippe
CNRS researcher, PMC, Ecole Polytechnique
Vahvistettu sähköpostiosoite verkkotunnuksessa polytechnique.edu
Nimike
Viittaukset
Viittaukset
Vuosi
Ostwald ripening in multicomponent alloys
T Philippe, PW Voorhees
Acta Materialia 61 (11), 4237-4244, 2013
2212013
Clustering and nearest neighbour distances in atom-probe tomography
T Philippe, F De Geuser, S Duguay, W Lefebvre, O Cojocaru-Mirédin, ...
Ultramicroscopy 109 (10), 1304-1309, 2009
1322009
Direct imaging of boron segregation to extended defects in silicon
S Duguay, T Philippe, F Cristiano, D Blavette
Applied Physics Letters 97 (24), 2010
602010
Application of Delaunay tessellation for the characterization of solute-rich clusters in atom probe tomography
W Lefebvre, T Philippe, F Vurpillot
Ultramicroscopy 111 (3), 200-206, 2011
522011
Modeling of precipitation kinetics in multicomponent systems: Application to model superalloys
M Bonvalet, T Philippe, X Sauvage, D Blavette
Acta Materialia 100, 169-177, 2015
432015
Clustering and local magnification effects in atom probe tomography: a statistical approach
T Philippe, M Gruber, F Vurpillot, D Blavette
Microscopy and Microanalysis 16 (5), 643-648, 2010
422010
Kinetics pathway of precipitation in model Co-Al-W superalloy
A Azzam, T Philippe, A Hauet, F Danoix, D Locq, P Caron, D Blavette
Acta Materialia 145, 377-387, 2018
402018
Clustering and pair correlation function in atom probe tomography
T Philippe, S Duguay, D Blavette
Ultramicroscopy 110 (7), 862-865, 2010
332010
Nucleation pathway in coherent precipitation
T Philippe, D Blavette
Philosophical Magazine 91 (36), 4606-4622, 2011
302011
SPALAX NG: A breakthrough in radioxenon field measurement
A Cagniant, S Topin, G Le Petit, P Gross, O Delaune, T Philippe, ...
Applied Radiation and Isotopes 134, 461-465, 2018
292018
Modeling interface-controlled phase transformation kinetics in thin films
EL Pang, NQ Vo, T Philippe, PW Voorhees
Journal of Applied Physics 117 (17), 2015
262015
Evidence of atomic-scale arsenic clustering in highly doped silicon
S Duguay, F Vurpillot, T Philippe, E Cadel, R Lardé, B Deconihout, ...
Journal of Applied Physics 106 (10), 2009
242009
6 months of radioxenon detection in western Europe with the SPALAX-New generation system-Part1: Metrological capabilities
S Topin, P Gross, P Achim, S Generoso, A Cagniant, O Delaune, M Morin, ...
Journal of Environmental Radioactivity 225, 106442, 2020
222020
Minimum free-energy pathway of nucleation
T Philippe, D Blavette
The Journal of chemical physics 135 (13), 2011
222011
Atomic scale evidence of the suppression of boron clustering in implanted silicon by carbon coimplantation
T Philippe, S Duguay, D Mathiot, D Blavette
Journal of Applied Physics 109 (2), 2011
182011
Atom-scale compositional distribution in InAlAsSb-based triple junction solar cells by atom probe tomography
J Hernández-Saz, M Herrera, FJ Delgado, S Duguay, T Philippe, ...
Nanotechnology 27 (30), 305402, 2016
172016
Thermal stability of amorphous Zn-In-Sn-O films
DE Proffit, T Philippe, JD Emery, Q Ma, BD Buchholz, PW Voorhees, ...
Journal of Electroceramics 34, 167-174, 2015
172015
Critical nucleus composition in a multicomponent system
T Philippe, D Blavette, PW Voorhees
The Journal of Chemical Physics 141 (12), 2014
162014
The influence of size on the composition of nano-precipitates in coherent precipitation
M Bonvalet, T Philippe, X Sauvage, D Blavette
Philosophical Magazine 94 (26), 2956-2966, 2014
142014
Point process statistics in atom probe tomography
T Philippe, S Duguay, G Grancher, D Blavette
Ultramicroscopy 132, 114-120, 2013
142013
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Artikkelit 1–20