Seuraa
Yixin Luo
Nimike
Viittaukset
Viittaukset
Vuosi
RowClone: Fast and energy-efficient in-DRAM bulk data copy and initialization
V Seshadri, Y Kim, C Fallin, D Lee, R Ausavarungnirun, G Pekhimenko, ...
Proceedings of the 46th Annual IEEE/ACM International Symposium on …, 2013
4602013
Error characterization, mitigation, and recovery in flash-memory-based solid-state drives
Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu
Proceedings of the IEEE 105 (9), 1666-1704, 2017
3262017
Data retention in MLC NAND flash memory: Characterization, optimization, and recovery
Y Cai, Y Luo, EF Haratsch, K Mai, O Mutlu
2015 IEEE 21st International Symposium on High Performance Computer …, 2015
3142015
Computational sprinting
A Raghavan, Y Luo, A Chandawalla, M Papaefthymiou, KP Pipe, ...
IEEE international symposium on high-performance comp architecture, 1-12, 2012
2312012
Read disturb errors in MLC NAND flash memory: Characterization, mitigation, and recovery
Y Cai, Y Luo, S Ghose, EF Haratsch, K Mai, O Mutlu
2015 45th Annual IEEE/IFIP International Conference on Dependable Systems …, 2015
2222015
Characterizing application memory error vulnerability to optimize datacenter cost via heterogeneous-reliability memory
Y Luo, S Govindan, B Sharma, M Santaniello, J Meza, A Kansal, J Liu, ...
2014 44th Annual IEEE/IFIP International Conference on Dependable Systems …, 2014
1892014
Vulnerabilities in MLC NAND flash memory programming: Experimental analysis, exploits, and mitigation techniques
Y Cai, S Ghose, Y Luo, K Mai, O Mutlu, EF Haratsch
2017 IEEE International Symposium on High Performance Computer Architecture …, 2017
1482017
WARM: Improving NAND flash memory lifetime with write-hotness aware retention management
Y Luo, Y Cai, S Ghose, J Choi, O Mutlu
2015 31st Symposium on Mass Storage Systems and Technologies (MSST), 1-14, 2015
1432015
Improving 3D NAND flash memory lifetime by tolerating early retention loss and process variation
Y Luo, S Ghose, Y Cai, EF Haratsch, O Mutlu
Proceedings of the ACM on Measurement and Analysis of Computing Systems 2 (3 …, 2018
1342018
HeatWatch: Improving 3D NAND flash memory device reliability by exploiting self-recovery and temperature awareness
Y Luo, S Ghose, Y Cai, EF Haratsch, O Mutlu
2018 IEEE International Symposium on High Performance Computer Architecture …, 2018
1222018
A case for efficient hardware/software cooperative management of storage and memory
J Meza, Y Luo, S Khan, J Zhao, Y Xie, O Mutlu
Carnegie Mellon University, 2013
1162013
FLIN: Enabling fairness and enhancing performance in modern NVMe solid state drives
A Tavakkol, M Sadrosadati, S Ghose, J Kim, Y Luo, Y Wang, NM Ghiasi, ...
2018 ACM/IEEE 45th Annual International Symposium on Computer Architecture …, 2018
852018
Enabling accurate and practical online flash channel modeling for modern MLC NAND flash memory
Y Luo, S Ghose, Y Cai, EF Haratsch, O Mutlu
IEEE Journal on Selected Areas in Communications 34 (9), 2294-2311, 2016
782016
Improving the reliability of chip-off forensic analysis of NAND flash memory devices
A Fukami, S Ghose, Y Luo, Y Cai, O Mutlu
Digital Investigation 20, S1-S11, 2017
662017
Errors in flash-memory-based solid-state drives: Analysis, mitigation, and recovery
Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu
arXiv preprint arXiv:1711.11427, 2017
572017
Bone fracture detection through the two-stage system of crack-sensitive convolutional neural network
Y Ma, Y Luo
Informatics in Medicine Unlocked 22, 100452, 2021
492021
A case for unlimited watchpoints
JL Greathouse, H Xin, Y Luo, T Austin
ACM SIGPLAN Notices 47 (4), 159-172, 2012
432012
Reliability issues in flash-memory-based solid-state drives: Experimental analysis, mitigation, recovery
Y Cai, S Ghose, EF Haratsch, Y Luo, O Mutlu
Inside Solid State Drives (SSDs), 233-341, 2018
362018
Architectural techniques for improving NAND flash memory reliability
Y Luo
arXiv preprint arXiv:1808.04016, 2018
222018
Designing for responsiveness with computational sprinting
A Raghavan, Y Luo, A Chandawalla, M Papaefthymiou, KP Pipe, ...
Ieee Micro 33 (3), 8-15, 2013
202013
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Artikkelit 1–20