| Effects of ion bombardment on a two-dimensional target: Atomistic simulations of graphene irradiation O Lehtinen, J Kotakoski, AV Krasheninnikov, A Tolvanen, K Nordlund, ... Physical review B 81 (15), 153401, 2010 | 422 | 2010 |
| Charge transfer resistance of spray deposited and compressed counter electrodes for dye-sensitized nanoparticle solar cells on plastic substrates J Halme, M Toivola, A Tolvanen, P Lund Solar Energy Materials and Solar Cells 90 (7-8), 872-886, 2006 | 88 | 2006 |
| Modifying the electronic structure of semiconducting single-walled carbon nanotubes by Ar+ ion irradiation A Tolvanen, G Buchs, P Ruffieux, P Gröning, O Gröning, ... Physical Review B 79 (12), 125430, 2009 | 63 | 2009 |
| Relative abundance of single and double vacancies in irradiated single-walled carbon nanotubes A Tolvanen, J Kotakoski, AV Krasheninnikov, K Nordlund Applied Physics Letters 91 (17), 2007 | 55 | 2007 |
| Growth of Single‐Walled Carbon Nanotubes from Sharp Metal Tips JA Rodríguez‐Manzo, I Janowska, C Pham‐Huu, A Tolvanen, ... small 5 (23), 2710-2715, 2009 | 30 | 2009 |
| Defect-induced junctions between single-or double-wall carbon nanotubes and metal crystals JA Rodríguez-Manzo, A Tolvanen, AV Krasheninnikov, K Nordlund, ... Nanoscale 2 (6), 901-905, 2010 | 29 | 2010 |
| Black silicon back‐contact module with wide light acceptance angle P Ortega, M Garín, G von Gastrow, T Savisalo, A Tolvanen, H Vahlman, ... Progress in Photovoltaics: Research and Applications 28 (3), 210-216, 2020 | 11 | 2020 |
| Plasticity of Cu nanoparticles: Dislocation-dendrite-induced strain hardening and a limit for displacive plasticity A Tolvanen, K Albe Beilstein journal of nanotechnology 4 (1), 173-179, 2013 | 9 | 2013 |
| Perspective pose estimation from uncertain omnidirectional image data C Gebken, A Tolvanen, C Perwass, G Sommer 18th International Conference on Pattern Recognition (ICPR'06) 1, 793-796, 2006 | 9 | 2006 |
| Characterization and manufacturing techniques of dye-sensitized solar cells A Tolvanen | 8 | 2003 |
| Projective model for central catadioptric cameras using Clifford algebra A Tolvanen, C Perwass, G Sommer Joint Pattern Recognition Symposium, 192-199, 2005 | 7 | 2005 |
| Pose estimation from uncertain omnidirectional image data using line-plane correspondences C Gebken, A Tolvanen, G Sommer Joint Pattern Recognition Symposium, 587-596, 2006 | 6 | 2006 |
| Capacitive effects in high-efficiency solar cells during IV curve measurement: considerations on error of correction and extraction of minority carrier lifetime H Vahlman, J Lipping, J Hyvärinen, A Tolvanen, S Hyvärinen, E Oy 8 pages/35th European Photovoltaic Solar Energy Conference and Exhibition …, 2018 | 5 | 2018 |
| Industrial applicability of antireflection-coating-free black silicon on PERC solar cells and modules T Pasanen, V Vähänissi, F Wolny, A Oehlke, M Wagner, MA Juntunen, ... European Photovoltaic Solar Energy Conference and Exhibition, 552-556, 2018 | 4 | 2018 |
| Effect of iron nanoparticle geometry on the energetics of carbon interstititals A Tolvanen, AV Krasheninnikov, A Kuronen, K Nordlund physica status solidi c 7 (3‐4), 1274-1278, 2010 | 3 | 2010 |
| (oral talk) Black silicon back contact module with wide light acceptance angle P Ortega, M Garin, G von Gastrow, T Savisalo, A Tolvanen, H Vahlman, ... SPIE Photonics West, 2020 | | 2020 |
| (invited talk) Industrial applicability of black silicon on PERC solar cells and modules T Pasanen, V Vähänissi, F Wolny, A Oehlke, M Wagner, MA Juntunen, ... Jiangsu-Europe International Conference on New Energy, 2018 | | 2018 |
| Reitistön Markkinointisuunnitelma: Partaharju-Nikkarila luontopolku S Damski, A Tolvanen Kaakkois-Suomen ammattikorkeakoulu, 2017 | | 2017 |
| Plasticity of Metal Nanoparticles in Nanoextrusion A Tolvanen, K Albe AIP Conference Proceedings, 2012 | | 2012 |
| Plasticity of Cu and Pd nanoparticles in nanoextrusion A Tolvanen, K Albe Verhandlungen der Deutschen Physikalischen Gesellschaft, 2011 | | 2011 |
Krasheninnikov ArkadyHelmholtz-Zentrum Dresden-RossendorfVerified email at hzdr.de
