Jacques Klein
Nimike
Viittaukset
Viittaukset
Vuosi
Flowdroid: Precise context, flow, field, object-sensitive and lifecycle-aware taint analysis for android apps
S Arzt, S Rasthofer, C Fritz, E Bodden, A Bartel, J Klein, Y Le Traon, ...
PLDI: Acm Sigplan Notices 49 (6), 259-269, 2014
18342014
Iccta: Detecting inter-component privacy leaks in android apps
L Li, A Bartel, TF Bissyandé, J Klein, Y Le Traon, S Arzt, S Rasthofer, ...
ICSE: Proceedings of the 37th International Conference on Software …, 2015
5562015
Effective inter-component communication mapping in android: An essential step towards holistic security analysis
D Octeau, P McDaniel, S Jha, A Bartel, E Bodden, J Klein, Y Le Traon
Usenix Security: Presented as part of the 22nd {USENIX} Security Symposium …, 2013
4982013
Androzoo: Collecting millions of android apps for the research community
K Allix, TF Bissyandé, J Klein, Y Le Traon
MSR: 2016 IEEE/ACM 13th Working Conference on Mining Software Repositories …, 2016
3832016
Automated and scalable t-wise test case generation strategies for software product lines
G Perrouin, S Sen, J Klein, B Baudry, Y Le Traon
ICST: Software Testing, Verification and Validation (ICST), 2010 Third …, 2010
2752010
Dexpler: converting android dalvik bytecode to jimple for static analysis with soot
A Bartel, J Klein, Y Le Traon, M Monperrus
Proceedings of the ACM SIGPLAN International Workshop on State of the Art in …, 2012
2632012
Static analysis of android apps: A systematic literature review
L Li, TF Bissyandé, M Papadakis, S Rasthofer, A Bartel, D Octeau, J Klein, ...
IST: Information and Software Technology 88, 67-95, 2017
1982017
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon
TSE: IEEE Transactions on Software Engineering 40 (7), 650-670, 2014
1822014
Aspect-oriented multi-view modeling
J Kienzle, W Al Abed, J Klein
AOSD: Proceedings of the 8th ACM international conference on Aspect-oriented …, 2009
1772009
Automatically securing permission-based software by reducing the attack surface: An application to android
A Bartel, J Klein, Y Le Traon, M Monperrus
ASE: Proceedings of the 27th IEEE/ACM International Conference on Automated …, 2012
1702012
Pairwise testing for software product lines: comparison of two approaches
G Perrouin, S Oster, S Sen, J Klein, B Baudry, Y Le Traon
SQJ: Software Quality Journal 20 (3-4), 605-643, 2012
1672012
Semantic-based weaving of scenarios
J Klein, L Hélouët, JM Jézéquel
AOSD: Proceedings of the 5th international conference on Aspect-oriented …, 2006
1492006
Understanding android app piggybacking: A systematic study of malicious code grafting
L Li, D Li, TF Bissyandé, J Klein, Y Le Traon, D Lo, L Cavallaro
TIFS: IEEE Transactions on Information Forensics and Security 12 (6), 1269-1284, 2017
1242017
Reconciling automation and flexibility in product derivation
G Perrouin, J Klein, N Guelfi, JM Jézéquel
SPLC: 2008 12th International Software Product Line Conference, 339-348, 2008
1242008
Droidra: Taming reflection to support whole-program analysis of android apps
L Li, TF Bissyandé, D Octeau, J Klein
ISSTA: Proceedings of the 25th International Symposium on Software Testing …, 2016
1222016
Multi-objective test generation for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, YL Traon
SPLC: Proceedings of the 17th International Software Product Line Conference …, 2013
1222013
Got issues? who cares about it? a large scale investigation of issue trackers from github
TF Bissyandé, D Lo, L Jiang, L Réveillere, J Klein, Y Le Traon
ISSRE: 2013 IEEE 24th international symposium on software reliability …, 2013
1182013
An investigation into the use of common libraries in android apps
L Li, TF Bissyandé, J Klein, Y Le Traon
SANER: 2016 IEEE 23rd International Conference on Software Analysis …, 2016
1122016
Highly precise taint analysis for android applications
C Fritz, S Arzt, S Rasthofer, E Bodden, A Bartel, J Klein, Y Le Traon, ...
1052013
Combining static analysis with probabilistic models to enable market-scale android inter-component analysis
D Octeau, S Jha, M Dering, P McDaniel, A Bartel, L Li, J Klein, Y Le Traon
POPL: ACM SIGPLAN Notices 51 (1), 469-484, 2016
1042016
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Artikkelit 1–20