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Igor Beinik
Igor Beinik
Research Engineer, MAX IV, Lund University
Verified email at maxiv.lu.se
Title
Cited by
Cited by
Year
Enhanced wetting of Cu on ZnO by migration of subsurface oxygen vacancies
I Beinik, M Hellström, TN Jensen, P Broqvist, JV Lauritsen
Nature Communications 6 (1), 8845, 2015
692015
Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
I Beinik, M Kratzer, A Wachauer, L Wang, RT Lechner, C Teichert, C Motz, ...
Journal of applied physics 110 (5), 2011
522011
Water Dissociation and Hydroxyl Ordering on Anatase
I Beinik, A Bruix, Z Li, KC Adamsen, S Koust, B Hammer, S Wendt, ...
Physical review letters 121 (20), 206003, 2018
412018
Single-layer MoS 2 formation by sulfidation of molybdenum oxides in different oxidation states on Au (111)
N Salazar, I Beinik, JV Lauritsen
Physical Chemistry Chemical Physics 19 (21), 14020-14029, 2017
402017
Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM
I Beinik, M Kratzer, A Wachauer, L Wang, YP Piryatinski, G Brauer, ...
Beilstein journal of nanotechnology 4 (1), 208-217, 2013
332013
Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
B Galiana, I Rey-Stolle, I Beinik, C Algora, C Teichert, ...
Solar energy materials and solar cells 95 (7), 1949-1954, 2011
302011
Conductive atomic-force microscopy investigation of nanostructures in microelectronics
C Teichert, I Beinik
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, 691-721, 2010
272010
Surface planarization and masked ion-beam structuring of YBa2Cu3O7 thin films
JD Pedarnig, K Siraj, MA Bodea, I Puica, W Lang, R Kolarova, P Bauer, ...
Thin Solid Films 518 (23), 7075-7080, 2010
262010
Subsurface hydrogen bonds at the polar Zn-terminated ZnO (0001) surface
M Hellström, I Beinik, P Broqvist, JV Lauritsen, K Hermansson
Physical Review B 94 (24), 245433, 2016
232016
Conductive atomic force microscopy study of InAs growth kinetics on vicinal GaAs (110)
P Tejedor, L Díez-Merino, I Beinik, C Teichert
Applied physics letters 95 (12), 2009
202009
Ion beam irradiation of cuprate high-temperature superconductors: Systematic modification of the electrical properties and fabrication of nanopatterns
W Lang, M Marksteiner, MA Bodea, K Siraj, JD Pedarnig, R Kolarova, ...
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2012
182012
Coverage-dependent oxidation and reduction of vanadium supported on anatase TiO2 (1 0 1)
S Koust, BN Reinecke, KC Adamsen, I Beinik, K Handrup, Z Li, PG Moses, ...
Journal of catalysis 360, 118-126, 2018
172018
Facile embedding of single vanadium atoms at the anatase TiO 2 (101) surface
S Koust, L Arnarson, PG Moses, Z Li, I Beinik, JV Lauritsen, S Wendt
Physical Chemistry Chemical Physics 19 (14), 9424-9431, 2017
172017
Scanning probe microscopy in nanoscience and nanotechnology 2
C Teichert, I Beinik, B Bhushan
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2, 691-721, 2011
162011
Step edge structures on the anatase TiO 2 (001) surface studied by atomic-resolution TEM and STM
M Ek, I Beinik, A Bruix, S Wendt, JV Lauritsen, S Helveg
Faraday discussions 208, 325-338, 2018
132018
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
G Brauer, W Anwand, D Grambole, W Egger, P Sperr, I Beinik, L Wang, ...
physica status solidi c 6 (11), 2556-2560, 2009
132009
Electrical and photovoltaic properties of self-assembled Ge nanodomes on Si (001)
M Kratzer, M Rubezhanska, C Prehal, I Beinik, SV Kondratenko, ...
Physical Review B 86 (24), 245320, 2012
122012
Nanoscale electrical characterization of arrowhead defects in GaInP thin films grown on Ge
I Beinik, B Galiana, M Kratzer, C Teichert, I Rey-Stolle, C Algora, ...
Journal of Vacuum Science & Technology B 28 (4), C5G5-C5G10, 2010
112010
KCl ultra-thin films with polar and non-polar surfaces grown on Si (111) 7× 7
I Beinik, C Barth, M Hanbücken, L Masson
Scientific Reports 5 (1), 8223, 2015
102015
Electrical characterization of semiconductor nanostructures by conductive probe based atomic force microscopy techniques
I Beinik
92011
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