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Veeresh Taranalli
Veeresh Taranalli
Senior Autonomy Engineer, Skydio
Verified email at ucsd.edu - Homepage
Title
Cited by
Cited by
Year
Error analysis and inter-cell interference mitigation in multi-level cell flash memories
V Taranalli, H Uchikawa, PH Siegel
2015 IEEE International Conference on Communications (ICC), 271-276, 2015
542015
Channel models for multi-level cell flash memories based on empirical error analysis
V Taranalli, H Uchikawa, PH Siegel
IEEE Transactions on Communications 64 (8), 3169-3181, 2016
432016
Multilingual spoken-password based user authentication in emerging economies using cellular phone networks
A Das, OK Manyam, M Tapaswi, V Taranalli
2008 IEEE Spoken Language Technology Workshop, 5-8, 2008
242008
Permuted successive cancellation decoding for polar codes
S Buzaglo, A Fazeli, PH Siegel, V Taranalli, A Vardy
2017 IEEE International Symposium on Information Theory (ISIT), 2618-2622, 2017
212017
On efficient decoding of polar codes with large kernels
S Buzaglo, A Fazeli, PH Siegel, V Taranalli, A Vardy
2017 IEEE Wireless Communications and Networking Conference Workshops (WCNCW …, 2017
142017
Polar codes for magnetic recording channels
A Bhatia, V Taranalli, PH Siegel, S Dahandeh, AR Krishnan, P Lee, D Qin, ...
2015 IEEE Information Theory Workshop (ITW), 1-5, 2015
142015
On the Capacity of the Beta-Binomial Channel Model for Multi-Level Cell Flash Memories
V Taranalli, H Uchikawa, PH Siegel
IEEE Journal on Selected Areas in Communications 34 (9), 2312 - 2324, 2016
122016
Adaptive linear programming decoding of polar codes
V Taranalli, PH Siegel
2014 IEEE International Symposium on Information Theory, 2982-2986, 2014
112014
CommPy: Digital Communication with Python
V Taranalli
https://github.com/veeresht/CommPy, 2015
72015
Commpy: digital communication with python. version 03 0
V Taranalli
42015
Error characterization, channel modeling and coding for flash memories
V Taranalli
University of California, San Diego, 2017
22017
Traffic boundary mapping
JA Cox, V Taranalli, DJ Julian, BN Chakravarthy, M Campos, AD Kahn, ...
US Patent US10891497B2, 2021
2021
Error characterization and comparison of ECCs on MLC and TLC flash memories
V Taranalli, E Yaakobi, PH Siegel
Flash Memory Summit (FMS), 2014, 2014
2014
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Articles 1–13