Internally resonating lattices for bandgap generation and low-frequency vibration control E Baravelli, M Ruzzene
Journal of Sound and Vibration 332 (25), 6562-6579, 2013
288 2013 Impact of line-edge roughness on FinFET matching performance E Baravelli, A Dixit, R Rooyackers, M Jurczak, NÒ Speciale, K De Meyer
IEEE Transactions on Electron Devices 54 (9), 2466-2474, 2007
170 2007 Impact of LER and random dopant fluctuations on FinFET matching performance E Baravelli, M Jurczak, N Speciale, K De Meyer, A Dixit
IEEE transactions on nanotechnology 7 (3), 291-298, 2008
120 2008 Warped basis pursuit for damage detection using lamb waves L De Marchi, M Ruzzene, B Xu, E Baravelli, N Speciale
IEEE transactions on ultrasonics, ferroelectrics, and frequency control 57 …, 2010
60 2010 TFET inverters with n-/p-devices on the same technology platform for low-voltage/low-power applications E Baravelli, E Gnani, A Gnudi, S Reggiani, G Baccarani
IEEE Transactions on Electron Devices 61 (2), 473-478, 2014
56 2014 Optimization of n- and p-type TFETs Integrated on the Same Technology Platform E Baravelli, E Gnani, R Grassi, A Gnudi, S Reggiani, G Baccarani
IEEE transactions on electron devices 61 (1), 178-185, 2013
56 2013 Impact of stochastic mismatch on measured SRAM performance of FinFETs with resist/spacer-defined fins: Role of line-edge-roughness A Dixit, KG Anil, E Baravelli, P Roussel, A Mercha, C Gustin, M Bamal, ...
2006 International Electron Devices Meeting, 1-4, 2006
54 2006 Double-channel, frequency-steered acoustic transducer with 2-D imaging capabilities E Baravelli, M Senesi, M Ruzzene, L De Marchi, N Speciale
IEEE transactions on ultrasonics, ferroelectrics, and frequency control 58 …, 2011
48 2011 Fabrication and characterization of a wavenumber-spiral frequency-steerable acoustic transducer for source localization in plate structures E Baravelli, M Senesi, M Ruzzene, L De Marchi
IEEE Transactions on Instrumentation and Measurement 62 (8), 2197-2204, 2013
34 2013 Fin shape fluctuations in FinFET: Correlation to electrical variability and impact on 6-T SRAM noise margins E Baravelli, L De Marchi, N Speciale
Solid-state electronics 53 (12), 1303-1312, 2009
30 2009 Guided wave expansion in warped curvelet frames L De Marchi, E Baravelli, M Ruzzene, N Speciale, G Masetti
IEEE transactions on ultrasonics, ferroelectrics, and frequency control 59 …, 2012
26 2012 High stiffness, high damping chiral metamaterial assemblies for low-frequency applications E Baravelli, M Carrara, M Ruzzene
Health Monitoring of Structural and Biological Systems 2013 8695, 706-715, 2013
18 2013 Wavelet-based adaptive mesh generation for device simulation L De Marchi, F Franzè, E Baravelli, N Speciale
Solid-state electronics 50 (4), 650-659, 2006
17 2006 Capacitance estimation for InAs Tunnel FETs by means of full-quantum k· p simulation E Gnani, E Baravelli, A Gnudi, S Reggiani, G Baccarani
Solid-State Electronics 108, 104-109, 2015
15 2015 Experimental demonstration of directional GW generation through wavenumber-spiral frequency steerable acoustic actuators M Senesi, E Baravelli, L De Marchi, M Ruzzene
2012 IEEE International Ultrasonics Symposium, 2694-2697, 2012
11 2012 Theoretical analysis and modeling for nanoelectronics G Baccarani, E Gnani, A Gnudi, S Reggiani
Solid-State Electronics 125, 2-13, 2016
10 2016 VDD scalability of FinFET SRAMs: Robustness of different design options against LER-induced variations E Baravelli, L De Marchi, N Speciale
Solid-state electronics 54 (9), 909-918, 2010
9 2010 Steep-slope devices: prospects and challenges E Gnani, E Baravelli, P Maiorano, A Gnudi, S Reggiani, G Baccarani
Journal of Nano Research 39, 3-16, 2016
8 2016 Warped Wigner‐Hough Transform for Defect Reflection Enhancement in Ultrasonic Guided Wave Monitoring L De Marchi, E Baravelli, G Cera, N Speciale, A Marzani
Mathematical Problems in Engineering 2012 (1), 358128, 2012
7 2012 Warped frequency transform for damage detection using Lamb waves L De Marchi, M Ruzzene, B Xu, E Baravelli, A Marzani, N Speciale
Health Monitoring of Structural and Biological Systems 2010 7650, 131-138, 2010
7 2010