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Wonik Jang
Wonik Jang
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Cited by
Year
Bridging TCAD and AI: its application to semiconductor design
C Jeong, S Myung, I Huh, B Choi, J Kim, H Jang, H Lee, D Park, K Lee, ...
IEEE Transactions on Electron Devices 68 (11), 5364-5371, 2021
332021
Real-time TCAD: A new paradigm for TCAD in the artificial intelligence era
S Myung, J Kim, Y Jeon, W Jang, I Huh, J Kim, S Han, K Baek, J Ryu, ...
2020 International Conference on Simulation of Semiconductor Processes and …, 2020
162020
Restructuring TCAD system: teaching traditional TCAD new tricks
S Myung, W Jang, S Jin, JM Choe, C Jeong, DS Kim
2021 IEEE International Electron Devices Meeting (IEDM), 18.2. 1-18.2. 4, 2021
102021
PAC-Net: A model pruning approach to inductive transfer learning
S Myung, I Huh, W Jang, JM Choe, J Ryu, D Kim, KE Kim, C Jeong
International Conference on Machine Learning, 16240-16252, 2022
52022
Tcad device simulation with graph neural network
W Jang, S Myung, JM Choe, YG Kim, DS Kim
IEEE Electron Device Letters, 2023
32023
Comprehensive studies on deep learning applicable to TCAD
S Myung, B Choi, W Jang, J Kim, I Huh, JM Choe, YG Kim, DS Kim
Japanese Journal of Applied Physics 62 (SC), SC0808, 2023
22023
Computing device, operating method of computing device, and storage medium
HUH In, S Myung, J Wonik, C Jeong
US Patent App. 16/907,780, 2021
12021
Semiconductor device simulation system and method
WI Jang, SH Myung, JM Choe
US Patent App. 18/099,083, 2024
2024
Non-transitory computer-readable medium storing program code generating wafer map based on generative adversarial networks and computing device including the same
J Wonik, S Myung, C Jeong, S Lee
US Patent 11,775,840, 2023
2023
Method and system for three-dimensional modeling
S Myung, J Wonik, C Jeong, J Choe
US Patent App. 17/972,809, 2023
2023
Deep Learning for Semiconductor Materials and Devices Design
C Jeong, S Myung, B Choi, J Kim, W Jang, I Huh, JM Choe, YG Kim, ...
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023
2023
Method of predicting semiconductor material properties and method of testing semiconductor device using the same
N Umezawa, C Jeong, J Ryu, KH Lee, J Lim, J Wonik, HUH In
US Patent App. 17/468,819, 2022
2022
Simulation method for semiconductor fabrication process and method for manufacturing semiconductor device
J Kim, S Myung, J Wonik, J Yongwoo, K Baek, J Ryu, C Jeong
US Patent App. 17/230,275, 2022
2022
조건부 오토인코더를 이용한 화학식 생성 연구
장원익, 조대진, 장경현, 박태규, 김재협
대한전자공학회 학술대회, 876-879, 2018
2018
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