| Process for engineering coherent twin and coincident site lattice grain boundaries in polycrystalline materials I Rauf US Patent 5,651,839, 1997 | 123 | 1997 |
| Structure and properties of tin‐doped indium oxide thin films prepared by reactive electron‐beam evaporation with a zone‐confining arrangement IA Rauf Journal of applied physics 79 (8), 4057-4065, 1996 | 108 | 1996 |
| Low resistivity and high mobility tin-doped indium oxide films IA Rauf Materials Letters 18 (3), 123-127, 1993 | 86 | 1993 |
| Effects of oxygen partial pressure on the properties of reactively evaporated thin films of indium oxide S Naseem, IA Rauf, K Hussain, NA Malik Thin solid films 156 (1), 161-171, 1988 | 84 | 1988 |
| Dose-rate dependence of electron-induced mass loss from organic specimens RF Egerton, I Rauf Ultramicroscopy 80 (4), 247-254, 1999 | 59 | 1999 |
| A novel method for preparing thin films with selective doping in a single evaporation step IA Rauf Journal of materials science letters 12 (24), 1902-1905, 1993 | 53 | 1993 |
| A review of materials selection for optimized efficiency in quantum dot sensitized solar cells: a simplified approach to reviewing literature data IA Rauf, P Rezai Renewable and Sustainable Energy Reviews 73, 408-422, 2017 | 27 | 2017 |
| Effects of microstructure on the optical properties of tin-doped indium oxide thin films studied by electron energy loss spectroscopy IA Rauf, J Yuan Materials letters 25 (5-6), 217-222, 1995 | 21 | 1995 |
| Extraction of free carrier density and mobility from the optical transmission data of tin-doped indium oxide thin films IA Rauf Materials Letters 23 (1-3), 73-78, 1995 | 15 | 1995 |
| In situ study of amorphous to crystalline transition in indium oxide thin films using transmission electron microscopy IA Rauf, LM Brown Acta metallurgica et materialia 42 (1), 57-64, 1994 | 15 | 1994 |
| A comparative study of microstructure (in ITO films) and techniques (CTEM and STM) IA Rauf, MG Walls Ultramicroscopy 35 (1), 19-26, 1991 | 15 | 1991 |
| A comparison of scanning tunnelling microscopy with conventional and scanning transmission electron microscopy using tin-doped indium oxide thin films IA Rauf Surface science 325 (1-2), L413-L419, 1995 | 8 | 1995 |
| The dominant scattering mechanisms in tin-doped indium oxide thin films IA Rauf Journal of Physics D: Applied Physics 27 (5), 1083, 1994 | 8 | 1994 |
| andP. H. Gaskell IA Rauf, MG Walls Trans. R. Microsc. Soc 1, 165, 1990 | 8 | 1990 |
| Direct observation of the birth of a nanocrystalline nucleus in an amorphous matrix IA Rauf Applied Physics Letters 93 (14), 2008 | 7 | 2008 |
| Microstructural evolution during thermomechanical processing of a Ti-Nb interstitial-free steel just below the Ar 3 temperature IA Rauf, JD Boyd Metallurgical and Materials Transactions A 28, 1437-1443, 1997 | 7 | 1997 |
| Physics of data science and machine learning IA Rauf CRC Press, 2021 | 6 | 2021 |
| Applied Statistical Design of Experiments: Applications in Natural Sciences IA Rauf Physical Chemistry and Biophysics 5 (5), 129-130, 2015 | 6 | 2015 |
| Microstructure of amorphous indium oxide and tin oxide thin films IA Rauf, LM Brown Scripta metallurgica et materialia 30 (6), 797-801, 1994 | 6 | 1994 |
| A cross-correlation measure of order in “amorphous” indium oxide JM Rodenburg, IA Rauf Inst Phys Conf Ser 98 (5), 119-122, 1989 | 6 | 1989 |
R F EgertonEmeritus Professor, University of AlbertaVahvistettu sähköpostiosoite verkkotunnuksessa ualberta.ca
