Wenbin Li
Title
Cited by
Cited by
Year
Revisiting Local Descriptor based Image-to-Class Measure for Few-shot Learning
W Li, L Wang, J Xu, J Huo, Y Gao, J Luo
IEEE Conference on Computer Vision and Pattern Recognition (CVPR 2019), 2019
932019
Distribution Consistency based Covariance Metric Networks for Few-shot Learning
W Li, J Xu, J Huo, L Wang, Y Gao, J Luo
AAAI Conference on Artificial Intelligence (AAAI 2019), 2019
322019
WebCaricature: a benchmark for caricature face recognition
J Huo, W Li, Y Shi, Y Gao, H Yin
British Machine Vision Conference (BMVC 2018), 2018
31*2018
OPML: A one-pass closed-form solution for online metric learning
W Li, Y Gao, L Wang, L Zhou, J Huo, Y Shi
Pattern Recognition (PR 2018) 75, 302-314, 2018
162018
Carigan: Caricature generation through weakly paired adversarial learning
W Li, W Xiong, H Liao, J Huo, Y Gao, J Luo
Neural Networks 132, 66-74, 2020
132020
Online Deep Metric Learning
W Li, J Huo, Y Shi, Y Gao, L Wang, J Luo
arXiv preprint arXiv:1805.05510, 2018
102018
Beyond IId: Learning to combine non-iid metrics for vision tasks
Y Shi, W Li, Y Gao, L Cao, D Shen
AAAI Conference on Artificial Intelligence (AAAI 2017), 2017
82017
A Novel Two-Stage Deep Method for Mitosis Detection in Breast Cancer Histology Images
M Ma, Y Shi, W Li, Y Gao, J Xu
International Conference on Pattern Recognition (ICPR 2018), 3892-3897, 2018
62018
Unsupervised few-shot learning via distribution shift-based augmentation
T Qin, W Li, Y Shi, Y Gao
arXiv preprint arXiv:2004.05805, 2020
52020
Interactive image segmentation via cascaded metric learning
W Li, Y Shi, W Yang, H Wang, Y Gao
IEEE International Conference on Image Processing (ICIP 2015), 2900-2904, 2015
32015
Alleviating the Incompatibility between Cross Entropy Loss and Episode Training for Few-shot Skin Disease Classification
W Zhu, H Liao, W Li, W Li, J Luo
MICCAI 2020, 2020
22020
Deep Embedded Complementary and Interactive Information for Multi-view Classification
J Xu, W Li, X Liu, D Zhang, J Liu, J Han
AAAI Conference on Artificial Intelligence (AAAI 2020), 2020
22020
Layerwise Sparse Coding for Pruned Deep Neural Networks with Extreme Compression Ratio
X Liu, W Li, J Huo, L Yao, Y Gao
AAAI Conference on Artificial Intelligence (AAAI 2020), 2020
12020
A Joint Local and Global Deep Metric Learning Method for Caricature Recognition
W Li, J Huo, Y Shi, Y Gao, L Wang, J Luo
Asian Conference on Computer Vision (ACCV 2018), 2018
12018
Temperature network for few-shot learning with distribution-aware large-margin metric
W Zhu, W Li, H Liao, J Luo
Pattern Recognition 112, 107797, 2021
2021
Progressive Point To Set Metric Learning For Semi-Supervised Few-Shot Classification
P Zhu, M Gu, W Li, C Zhang, Q Hu
2020 IEEE International Conference on Image Processing (ICIP), 196-200, 2020
2020
Manifold Alignment for Semantically Aligned Style Transfer
J Huo, S Jin, W Li, J Wu, YK Lai, Y Shi, Y Gao
arXiv preprint arXiv:2005.10777, 2020
2020
Asymmetric Distribution Measure for Few-shot Learning
W Li, L Wang, J Huo, Y Shi, Y Gao, J Luo
International Joint Conference on Artificial Intelligence (IJCAI 2020), 2020
2020
Biased Feature Learning for Occlusion Invariant Face Recognition
C Shao, J Huo, L Qi, ZH Feng, W Li, C Dong, Y Gao
International Joint Conference on Artificial Intelligence (IJCAI 2020), 2020
2020
Joint Multi-view 2D Convolutional Neural Networks for 3D Object Classification
J Xu, X Zhang, W Li, X Liu, J Han
International Joint Conference on Artificial Intelligence (IJCAI 2020), 2020
2020
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