Viewing stemming as recall enhancement W Kraaij, R Pohlmann Proceedings of the 19th annual international ACM SIGIR conference on …, 1996 | 296 | 1996 |
Porter’s stemming algorithm for Dutch W Kraaij, R Pohlmann Informatiewetenschap, 167-180, 1994 | 127 | 1994 |
Twenty-one at TREC-8: using language technology for information retrieval W Kraaij, R Pohlmann, D Hiemstra Gaithersburg: National Institute of Standards and Technology, 2000 | 59 | 2000 |
Comparing the effect of syntactic vs. statistical phrase indexing strategies for Dutch W Kraaij, R Pohlmann International Conference on Theory and Practice of Digital Libraries, 605-617, 1998 | 51 | 1998 |
Translation resources, merging strategies, and relevance feedback for cross-language information retrieval D Hiemstra, W Kraaij, R Pohlmann, T Westerveld Workshop of the Cross-Language Evaluation Forum for European Languages, 102-115, 2000 | 46 | 2000 |
Evaluation of a Dutch stemming algorithm W Kraaij, R Pohlmann The New Review of Document and Text Management 1, 25-43, 1995 | 41 | 1995 |
The Effect of Syntactic Phrase Indexing on Retrieval Performance for Dutch Texts R Pohlmann, W Kraaij, OTS UiL 5th international conference on "Recherche d'Information Assistée par …, 1997 | 29 | 1997 |
Using Linguistic Knowledge in Information Retrieval - Technical Report W Kraaij, R Pohlmann Research Institute for Language and Speech - OTS, 1996 | 18* | 1996 |
Improving the precision of a text retrieval system with compound analysis R Pohlmann, W Kraaij Computational Linguistics in the Netherlands 1996 - Papers from the Seventh …, 1996 | 16 | 1996 |
Different approaches to cross language information retrieval W Kraaij, R Pohlmann Computational Linguistics in the Netherlands 2000, 97-110, 2001 | 15 | 2001 |
Twenty-One at CLEF-2000: Translation resources, merging strategies and relevance feedback D Hiemstra, W Kraaij, R Pohlmann, T Westerveld Sl: CEUR, 2000 | 15 | 2000 |
Twenty-one at TREC-8: using language technology for information retrieval. In (Voorhees and Harman, 2000) W Kraaij, R Pohlmann, D Hiemstra NIST Special Publication, 500-246, 2000 | 4 | 2000 |