Carbon‐Double‐Bond‐Free Printed Solar Cells from TiO2/CH3NH3PbI3/CuSCN/Au: Structural Control and Photoaging Effects S Ito, S Tanaka, H Vahlman, H Nishino, K Manabe, P Lund ChemPhysChem 15 (6), 1194-1200, 2014 | 195 | 2014 |
In situ image processing method to investigate performance and stability of dye solar cells MI Asghar, K Miettunen, S Mastroianni, J Halme, H Vahlman, P Lund Solar Energy 86 (1), 331-338, 2012 | 56 | 2012 |
Recombination activity of light-activated copper defects in p-type silicon studied by injection-and temperature-dependent lifetime spectroscopy A Inglese, J Lindroos, H Vahlman, H Savin Journal of Applied Physics 120 (12), 2016 | 48 | 2016 |
Modeling of light-induced degradation due to Cu precipitation in p-type silicon. II. Comparison of simulations and experiments H Vahlman, A Haarahiltunen, W Kwapil, J Schön, A Inglese, H Savin Journal of Applied Physics 121 (19), 2017 | 27 | 2017 |
Low-temperature dark anneal as pre-treatment for LeTID in multicrystalline silicon M Yli-Koski, M Serué, C Modanese, H Vahlman, H Savin Solar Energy Materials and Solar Cells 192, 134-139, 2019 | 24 | 2019 |
Impact of copper on light-induced degradation in Czochralski silicon PERC solar cells C Modanese, M Wagner, F Wolny, A Oehlke, HS Laine, A Inglese, ... Solar Energy Materials and Solar Cells 186, 373-377, 2018 | 24 | 2018 |
Modeling of light-induced degradation due to Cu precipitation in p-type silicon. I. General theory of precipitation under carrier injection H Vahlman, A Haarahiltunen, W Kwapil, J Schön, A Inglese, H Savin Journal of Applied Physics 121 (19), 2017 | 20 | 2017 |
Light‐induced degradation in quasi‐monocrystalline silicon PERC solar cells: Indications on involvement of copper H Vahlman, M Wagner, F Wolny, A Krause, H Laine, A Inglese, ... physica status solidi (a) 214 (7), 1700321, 2017 | 15 | 2017 |
LeTID mitigation via an adapted firing process in p‐type PERC cells from SMART cast‐monocrystalline, Czochralski and high‐performance multicrystalline silicon F Maischner, S Maus, J Greulich, S Lohmüller, E Lohmüller, P Saint‐Cast, ... Progress in Photovoltaics: Research and Applications 30 (2), 123-131, 2022 | 14 | 2022 |
Comparison of plastic based counter electrodes for dye sensitized solar cells G Hashmi, K Miettunen, J Halme, I Asghar, H Vahlman, T Saukkonen, ... Journal of the Electrochemical Society 159 (7), H656, 2012 | 13 | 2012 |
Black silicon back‐contact module with wide light acceptance angle P Ortega, M Garín, G von Gastrow, T Savisalo, A Tolvanen, H Vahlman, ... Progress in Photovoltaics: Research and Applications 28 (3), 210-216, 2020 | 11 | 2020 |
Rapid thermal anneal activates light induced degradation due to copper redistribution N Nampalli, HS Laine, J Colwell, V Vähänissi, A Inglese, C Modanese, ... Applied Physics Letters 113 (3), 2018 | 11 | 2018 |
On the mass transport in apparently iodine-free ionic liquid polyaniline-coated carbon black composite electrolytes in dye-sensitized solar cells H Vahlman, J Halme, J Korhonen, K Aitola, J Patakangas The Journal of Physical Chemistry C 117 (23), 11920-11929, 2013 | 9 | 2013 |
High-intensity illumination treatments against LeTID–Intensity and temperature dependence of stability and inline feasibility H Vahlman, S Roder, J Nekarda, S Rein Solar Energy Materials and Solar Cells 223, 110978, 2021 | 5 | 2021 |
Capacitive Effects in High-Efficiency Solar Cells During IV-Curve Measurement: Considerations on Error of Correction and Extraction of Minority Carrier Lifetime H Vahlman, J Lipping, J Hyvärinen, A Tolvanen, S Hyvärinen Proceedings of the 35th EU PVSEC 2018, 254-261, 2018 | 5 | 2018 |
Industrial Applicability of Antireflection-Coating-Free Black Silicon on PERC Solar Cells and Modules TP Pasanen, V Vähänissi, F Wolny, A Oehlke, M Wagner, MA Juntunen, ... 35th European Photovoltaic Solar Energy Conference and Exhibition, 552 - 556, 2018 | 4 | 2018 |
Characterization of light‐activated Cu defects in silicon: Comparison with the recombination activity of metallic precipitates A Inglese, H Vahlman, W Kwapil, J Schön, H Savin physica status solidi c 14 (7), 1700103, 2017 | 4 | 2017 |
Monitoring of Porous Silicon Layers Used for Epitaxial Wafer Production With Inline Reflectance Spectroscopy HJ Vahlman, S Al-Hajjawi, J Haunschild, N Wöhrle, M Richter, L Jablonka, ... IEEE Journal of Photovoltaics 12 (4), 989-998, 2022 | 3 | 2022 |
Effect of low-temperature annealing on defect causing copper-related light-induced degradation in p-type silicon H Vahlman, A Haarahiltunen, W Kwapil, J Schön, M Yli-Koski, A Inglese, ... Energy Procedia 124, 188-196, 2017 | 2 | 2017 |
Monitoring of porous silicon layers for epitaxial wafer production using inline reflectance spectroscopy H Vahlman, S Al-Hajjawi, J Haunschild, N Wöhrle, M Richter, L Jablonka, ... AIP Conference Proceedings 2826 (1), 2023 | 1 | 2023 |