| Atomic force acoustic microscopy methods to determine thin-film elastic properties DC Hurley, K Shen, NM Jennett, JA Turner Journal of applied physics 94 (4), 2347-2354, 2003 | 219 | 2003 |
| Contact mechanics and tip shape in AFM-based nanomechanical measurements M Kopycinska-Müller, RH Geiss, DC Hurley Ultramicroscopy 106 (6), 466-474, 2006 | 217 | 2006 |
| Acoustic-phonon propagation in superlattices SI Tamura, DC Hurley, JP Wolfe Physical Review B 38 (2), 1427, 1988 | 216 | 1988 |
| Contact-resonance atomic force microscopy for viscoelasticity PA Yuya, DC Hurley, JA Turner Journal of Applied Physics 104 (7), 2008 | 208 | 2008 |
| Viscoelastic property mapping with contact resonance force microscopy JP Killgore, DG Yablon, AH Tsou, A Gannepalli, PA Yuya, JA Turner, ... Langmuir 27 (23), 13983-13987, 2011 | 189 | 2011 |
| Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods DC Hurley, M Kopycinska-Mueller, AB Kos, RH Geiss Measurement science and technology 16 (11), 2167, 2005 | 135 | 2005 |
| Quantitative viscoelastic mapping of polyolefin blends with contact resonance atomic force microscopy DG Yablon, A Gannepalli, R Proksch, J Killgore, DC Hurley, J Grabowski, ... Macromolecules 45 (10), 4363-4370, 2012 | 115 | 2012 |
| Elastic-property measurements of ultrathin films using atomic force acoustic microscopy M Kopycinska-Mueller, RH Geiss, J Mueller, DC Hurley Nanotechnology 16 (6), 703, 2005 | 110 | 2005 |
| Quantitative subsurface contact resonance force microscopy of model polymer nanocomposites JP Killgore, JY Kelly, CM Stafford, MJ Fasolka, DC Hurley Nanotechnology 22 (17), 175706, 2011 | 107 | 2011 |
| Relationship between Q-factor and sample damping for contact resonance atomic force microscope measurement of viscoelastic properties PA Yuya, DC Hurley, JA Turner Journal of Applied Physics 109 (11), 2011 | 102 | 2011 |
| Nonlinear ultrasonic parameter in quenched martensitic steels DC Hurley, D Balzar, PT Purtscher, KW Hollman Journal of Applied Physics 83 (9), 4584-4588, 1998 | 101 | 1998 |
| Method and apparatus for a multi-channel multi-frequency data acquisition system for nondestructive eddy current inspection testing JD Young, KH Hedengren, DC Hurley US Patent 5,182,513, 1993 | 100 | 1993 |
| Determination of the nonlinear ultrasonic parameter using a Michelson interferometer DC Hurley, CM Fortunko Measurement science and technology 8 (6), 634, 1997 | 99 | 1997 |
| Nanomechanical mapping with resonance tracking scanned probe microscope AB Kos, DC Hurley Measurement Science and Technology 19 (1), 015504, 2007 | 98 | 2007 |
| Nanomechanical mapping of the osteochondral interface with contact resonance force microscopy and nanoindentation SE Campbell, VL Ferguson, DC Hurley Acta biomaterialia 8 (12), 4389-4396, 2012 | 95 | 2012 |
| Nanoscale characterization of natural fibers and their composites using contact-resonance force microscopy SS Nair, S Wang, DC Hurley Composites Part A: Applied Science and Manufacturing 41 (5), 624-631, 2010 | 93 | 2010 |
| Spring constant calibration of atomic force microscopy cantilevers with a piezosensor transfer standard ED Langlois, GA Shaw, JA Kramar, JR Pratt, DC Hurley Review of Scientific Instruments 78 (9), 2007 | 93 | 2007 |
| Surface acoustic wave methods to determine the anisotropic elastic properties of thin films DC Hurley, VK Tewary, AJ Richards Measurement Science and Technology 12 (9), 1486, 2001 | 91 | 2001 |
| Contact resonance force microscopy techniques for nanomechanical measurements B Bhushan, H Fuchs, DC Hurley Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques, 97-138, 2009 | 84 | 2009 |
| Phonon focusing in cubic crystals DC Hurley, JP Wolfe Physical Review B 32 (4), 2568, 1985 | 84 | 1985 |
