| Promising Thermoelectric Properties of Commercial PEDOT:PSS Materials and Their Bi2Te3 Powder Composites B Zhang, J Sun, HE Katz, F Fang, RL Opila ACS applied materials & interfaces 2 (11), 3170-3178, 2010 | 519 | 2010 |
| Phase separation and interfacial reaction of high-k HfAlOx films prepared by pulsed-laser deposition in oxygen-deficient ambient XY Qiu, HW Liu, F Fang, MJ Ha, JM Liu Applied physics letters 88 (7), 2006 | 33 | 2006 |
| Thermal stability and dielectric properties of ultrathin CaZrOx films prepared by pulsed laser deposition XY Qiu, HW Liu, F Fang, MJ Ha, XH Zhou, JM Liu Applied Physics A 81, 1431-1434, 2005 | 19 | 2005 |
| Signal response metrology (SRM): a new approach for lithography metrology S Pandev, F Fang, YK Kim, J Tsai, A Vaid, L Subramany, D Sanko, ... Metrology, Inspection, and Process Control for Microlithography XXIX 9424 …, 2015 | 18 | 2015 |
| Interfacial properties of high-k dielectric CaZrOx films deposited by pulsed laser deposition XY Qiu, HW Liu, F Fang, MJ Ha, ZG Liu, JM Liu Applied physics letters 88 (18), 2006 | 15 | 2006 |
| Improving OCD time to solution using signal response metrology F Fang, X Zhang, A Vaid, S Pandev, D Sanko, V Ramanathan, ... Metrology, Inspection, and Process Control for Microlithography XXX 9778, 51-60, 2016 | 14 | 2016 |
| Scatterometry-based metrology for SAQP pitch walking using virtual reference T Kagalwala, A Vaid, S Mahendrakar, M Lenahan, F Fang, P Isbester, ... Metrology, Inspection, and Process Control for Microlithography XXX 9778 …, 2016 | 14 | 2016 |
| Preparation of clean Bi2Te3 and Sb2Te3 thin films to determine alignment at valence band maxima F Fang, RL Opila, R Venkatasubramanian, T Colpitts Journal of Vacuum Science & Technology A 29 (3), 2011 | 13 | 2011 |
| Measuring self-aligned quadruple patterning pitch walking with scatterometry-based metrology utilizing virtual reference T Kagalwala, A Vaid, S Mahendrakar, M Lenahan, F Fang, P Isbester, ... Journal of Micro/Nanolithography, MEMS, and MOEMS 15 (4), 044004-044004, 2016 | 10 | 2016 |
| Metallic iron-based nanoparticles for biomedical applications H Khurshid, V Tzitzios, L Colak, F Fang, GC Hadjipanayis Journal of Physics: Conference Series 200 (7), 072049, 2010 | 9 | 2010 |
| Correlation study of actual temperature profile and in-line metrology measurements for within-wafer uniformity improvement and wafer edge yield enhancement F Fang, A Vaid, A Vinslava, R Casselberry, S Mishra, D Dixit, P Timoney, ... Metrology, Inspection, and Process Control for Microlithography XXXII 10585 …, 2018 | 7 | 2018 |
| SAQP pitch walk metrology using single target metrology F Fang, P Herrera, T Kagalwala, J Camp, A Vaid, S Pandev, F Zach Metrology, Inspection, and Process Control for Microlithography XXXI 10145 …, 2017 | 3 | 2017 |
| Optical metrology solutions for 10nm films process control challenges S Mahendrakar, A Vaid, K Venkataraman, M Lenahan, S Seipp, F Fang, ... Metrology, Inspection, and Process Control for Microlithography XXX 9778 …, 2016 | 3 | 2016 |
| Monte Carlo simulation of the spontaneous oscillation in electron-chemical deposition JML M.J. Ha, F. Fang European Phys Journal D, 34, 195, 2005 | 3 | 2005 |
| Surface Analysis Meets Microscopy: Chemical Changes in Matisse Paintings RL Opila, J Church, F Fang, JL Mass Microscopy and Microanalysis 18 (S2), 896-897, 2012 | 2 | 2012 |
| Chemical and electrical properties of ZnTe based solar cells F Fang, BE McCandless, RL Opila 2009 34th IEEE Photovoltaic Specialists Conference (PVSC), 001258-001263, 2009 | 2 | 2009 |
| Interfacial microstructure of high-kappa dielectric CaZrOx films deposited by pulse laser deposition in low oxygen pressure JML X.Y. Qiu, H.W. Liu, F. Fang, M.J. Ha INTEGRATED FERROELECTRICS 74, 103, 2005 | 2 | 2005 |
| Heat transport in thermoelectrics Y Wang Purdue University, 2011 | 1 | 2011 |
| An Interface Kinetics Study of Oxidation Process of Silicon F Fang, MJ Ha, XY Qiu, JM Liu Integrated Ferroelectrics 74 (1), 31-43, 2005 | 1 | 2005 |
| New methodologies: Development of focus monitoring on product X Hao, F Fang, YK Kim, JM Gomez, V Ramanathan, C Sparka, ... 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2017 | | 2017 |
R OpilaUniversity of DelawareVerified email at udel.edu
