Chen Zhou
Title
Cited by
Cited by
Year
Secure and reliable XOR arbiter PUF design: An experimental study based on 1 trillion challenge response pair measurements
C Zhou, KK Parhi, CH Kim
Proceedings of the 54th Annual Design Automation Conference 2017, 1-6, 2017
352017
Estimating delay differences of arbiter PUFs using silicon data
SVS Avvaru, C Zhou, S Satapathy, Y Lao, CH Kim, KK Parhi
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 543-546, 2016
212016
Soft response generation and thresholding strategies for linear and feed-forward MUX PUFs
C Zhou, S Satapathy, Y Lao, KK Parhi, CH Kim
Proceedings of the 2016 International Symposium on Low Power Electronics and …, 2016
202016
A DRAM based physical unclonable function capable of generating >1032Challenge Response Pairs per 1Kbit array for secure chip authentication
Q Tang, C Zhou, W Choi, G Kang, J Park, KK Parhi, CH Kim
2017 IEEE Custom Integrated Circuits Conference (CICC), 1-4, 2017
162017
A data remanence based approach to generate 100% stable keys from an sram physical unclonable function
M Liu, C Zhou, Q Tang, KK Parhi, CH Kim
2017 IEEE/ACM International Symposium on Low Power Electronics and Design …, 2017
122017
Estimation of instantaneous frequency fluctuation in a fast DVFS environment using an empirical BTI stress-relaxation model
C Zhou, X Wang, W Xu, Y Zhu, VJ Reddi, CH Kim
2014 IEEE International Reliability Physics Symposium, 2D. 2.1-2D. 2.6, 2014
112014
Effect of aging on linear and nonlinear MUX PUFs by statistical modeling
A Koyily, SVS Avvaru, C Zhou, CH Kim, KK Parhi
2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), 76-83, 2018
92018
Predicting hard and soft-responses and identifying stable challenges of MUX PUFs using ANNs
SVS Avvaru, C Zhou, CH Kim, KK Parhi
2017 IEEE 60th International Midwest Symposium on Circuits and Systems …, 2017
92017
Predicting soft-response of MUX PUFs via logistic regression of total delay difference
A Koyily, C Zhou, CH Kim, KK Parhi
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018
42018
Effect of HCI degradation on the variability of MOSFETS
C Zhou, KA Jenkins, PI Chuang, C Vezyrtzis
2018 IEEE International Reliability Physics Symposium (IRPS), P-RT. 1-1-P-RT …, 2018
42018
High frequency AC electromigration lifetime measurements from a 32nm test chip
C Zhou, X Wang, R Fung, SJ Wen, R Wong, CH Kim
2015 Symposium on VLSI Technology (VLSI Technology), T42-T43, 2015
42015
A circuit-based approach for characterizing high frequency electromigration effects
C Zhou, X Wang, R Fung, SJ Wen, R Wong, CH Kim
IEEE Transactions on Device and Materials Reliability 17 (4), 763-772, 2017
32017
An entropy test for determining whether a MUX PUF is linear or nonlinear
A Koyily, C Zhou, CH Kim, KK Parhi
2017 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2017
32017
Electromigration effects in power grids characterized using an on-chip test structure with poly heaters and voltage tapping points
C Zhou, R Wong, SJ Wen, CH Kim
2018 IEEE Symposium on VLSI Technology, 19-20, 2018
12018
Characterizing Electromigration Effects in a 16nm FinFET Process Using a Circuit Based Test Vehicle
N Pande, C Zhou, MH Lin, R Fung, R Wong, S Wen, CH Kim
2019 IEEE International Electron Devices Meeting (IEDM), 5.3. 1-5.3. 4, 2019
2019
Electromigration Effects in Power Grids Characterized From a 65 nm Test Chip
C Zhou, R Fung, SJ Wen, R Wong, CH Kim
IEEE Transactions on Device and Materials Reliability 20 (1), 74-83, 2019
2019
Stable memory cell identification for hardware security
M Liu, C Zhou, KK Parhi, H Kim
US Patent App. 15/874,512, 2019
2019
Characterization of Integrated Circuit Reliability and Security Using On-Chip Monitoring Circuits
C Zhou
2018
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