Seuraa
Costas Argyrides
Costas Argyrides
Advanced Micro Devices (AMD), Inc
Vahvistettu sähköpostiosoite verkkotunnuksessa costas.cy - Kotisivu
Nimike
Viittaukset
Viittaukset
Vuosi
Matrix codes for reliable and cost efficient memory chips
C Argyrides, DK Pradhan, T Kocak
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (3), 420-428, 2009
1352009
Matrix-based codes for adjacent error correction
CA Argyrides, P Reviriego, DK Pradhan, JA Maestro
IEEE Transactions on Nuclear Science 57 (4), 2106-2111, 2010
582010
Matrix codes: Multiple bit upsets tolerant method for SRAM memories
C Argyrides, HR Zarandi, DK Pradhan
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
572007
Extending 3-bit burst error-correction codes with quadruple adjacent error correction
J Li, P Reviriego, L Xiao, C Argyrides, J Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (2), 221-229, 2017
432017
Efficient error detection in Double Error Correction BCH codes for memory applications
P Reviriego, C Argyrides, JA Maestro
Microelectronics Reliability 52 (7), 1528-1530, 2012
342012
Fast SEU detection and correction in LUT configuration bits of SRAM-based FPGAs
HR Zarandi, SG Miremadi, C Argyrides, DK Pradhan
2007 IEEE International Parallel and Distributed Processing Symposium, 1-6, 2007
342007
Improved decoding algorithm for high reliable reed muller coding
C Argyrides, DK Pradhan
2007 IEEE International SOC Conference, 95-98, 2007
312007
Multiple upsets tolerance in SRAM memory
C Argyrides, HR Zarandi, DK Pradhan
2007 IEEE International Symposium on Circuits and Systems, 365-368, 2007
282007
Reliability analysis of H-tree random access memories implemented with built in current sensors and parity codes for multiple bit upset correction
C Argyrides, R Chipana, F Vargas, DK Pradhan
IEEE Transactions on Reliability 60 (3), 528-537, 2011
262011
Single element correction in sorting algorithms with minimum delay overhead
CA Argyrides, CA Lisboa, DK Pradhan, L Carro
2009 10th Latin American Test Workshop, 1-6, 2009
252009
Improving memory reliability against soft errors using block parity
P Reviriego, C Argyrides, JA Maestro, DK Pradhan
IEEE Transactions on Nuclear Science 58 (3), 981-986, 2011
212011
Fault tolerant single error correction encoders
JA Maestro, P Reviriego, C Argyrides, DK Pradhan
Journal of Electronic Testing 27, 215-218, 2011
202011
Embedding current monitoring in H-tree RAM architecture for multiple SEU tolerance and reliability improvement
C Argyrides, F Vargas, M Moraes, DK Pradhan
2008 14th IEEE International On-Line Testing Symposium, 155-160, 2008
112008
Single error correcting finite field multipliers over GF (2m)
J Mathew, A Costas, AM Jabir, H Rahaman, DK Pradhan
21st International Conference on VLSI Design (VLSID 2008), 33-38, 2008
112008
Using single error correction codes to protect against isolated defects and soft errors
C Argyrides, P Reviriego, JA Maestro
IEEE Transactions on Reliability 62 (1), 238-243, 2013
102013
Using single error correction codes to protect against isolated defects and soft errors
C Argyrides, P Reviriego, JA Maestro
IEEE Transactions on Reliability 62 (1), 238-243, 2013
102013
Algorithm level fault tolerance: a technique to cope with long duration transient faults in matrix multiplication algorithms
CAL Lisboa, C Argyrides, DK Pradhan, L Carro
26th IEEE VLSI Test Symposium (vts 2008), 363-370, 2008
102008
Decimal Hamming: A software-implemented technique to cope with soft errors
C Argyrides, RR Ferreira, CA Lisboa, L Carro
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011
92011
A soft error robust and power aware memory design
C Argyrides, CA Lisboa, L Carro, DK Pradhan
Proceedings of the 20th annual conference on Integrated circuits and systems …, 2007
82007
A fast error correction technique for matrix multiplication algorithms
C Argyrides, CAL Lisboa, DK Pradhan, L Carro
2009 15th IEEE International On-Line Testing Symposium, 133-137, 2009
72009
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Artikkelit 1–20