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Hangfang Zhang
Hangfang Zhang
Verified email at vanderbilt.edu
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Year
SMARS: Sleep monitoring via ambient radio signals
F Zhang, C Wu, B Wang, M Wu, D Bugos, H Zhang, KJR Liu
IEEE Transactions on Mobile Computing 20 (1), 217-231, 2019
1012019
Method, apparatus, server and system for real-time vital sign detection and monitoring
F Zhang, C Chen, Q Xu, B Wang, C Wu, H Zhang, W Chau-Wai, ...
US Patent 10,495,725, 2019
392019
Temperature dependence of soft-error rates for FF designs in 20-nm bulk planar and 16-nm bulk FinFET technologies
H Zhang, H Jiang, TR Assis, DR Ball, K Ni, JS Kauppila, RD Schrimpf, ...
2016 IEEE International Reliability Physics Symposium (IRPS), 5C-3-1-5C-3-5, 2016
362016
Angular effects of heavy-ion strikes on single-event upset response of flip-flop designs in 16-nm bulk FinFET technology
H Zhang, H Jiang, TR Assis, DR Ball, B Narasimham, A Anvar, ...
IEEE Transactions on Nuclear Science 64 (1), 491-496, 2016
352016
Effects of threshold voltage variations on single-event upset response of sequential circuits at advanced technology nodes
H Zhang, H Jiang, TR Assis, NN Mahatme, B Narasimham, LW Massengill, ...
IEEE Transactions on Nuclear Science 64 (1), 457-463, 2016
342016
Apparatus, systems and methods for fall-down detection based on a wireless signal
F Zhang, C Chen, Q Xu, B Wang, C Wu, H Zhang, W Chau-Wai, ...
US Patent 10,397,039, 2019
332019
Apparatus, systems and methods for event recognition based on a wireless signal
Q Xu, F Zhang, C Chen, B Wang, C Wu, H Zhang, W Chau-Wai, ...
US Patent 10,374,863, 2019
322019
Method, apparatus, and system for vehicle wireless monitoring
CL Mai, JF Lee, DN Claffey, H Zhang, F Zhang, HQD Lai, B Wang, ...
US Patent App. 17/019,270, 2020
172020
Method, apparatus, server and system for vital sign detection and monitoring
C Chen, F Zhang, Q Xu, B Wang, C Wu, H Zhang, W Chau-Wai, ...
US Patent 10,735,298, 2020
152020
Effects of temperature and supply voltage on SEU-and SET-induced errors in bulk 40-nm sequential circuits
RM Chen, ZJ Diggins, NN Mahatme, L Wang, EX Zhang, YP Chen, ...
IEEE Transactions on Nuclear Science 64 (8), 2122-2128, 2017
152017
An empirical model for predicting SE cross section for combinational logic circuits in advanced technologies
H Jiang, H Zhang, JS Kauppila, LW Massengill, BL Bhuva
IEEE Transactions on Nuclear Science 65 (1), 304-310, 2017
122017
Effects of total-ionizing-dose irradiation on single-event response for flip-flop designs at a 14-/16-nm bulk FinFET technology node
H Zhang, H Jiang, X Fan, JS Kauppila, I Chatterjee, BL Bhuva, ...
IEEE Transactions on Nuclear Science 65 (8), 1928-1934, 2017
112017
Frequency dependence of heavy-ion-induced single-event responses of flip-flops in a 16-nm bulk FinFET technology
H Zhang, H Jiang, BL Bhuva, JS Kauppila, WT Holman, LW Massengill
IEEE Transactions on Nuclear Science 65 (1), 413-417, 2017
112017
Thermal neutron-induced soft-error rates for flip-flop designs in 16-nm bulk FinFET technology
H Zhang, H Jiang, JD Brockman, TR Assis, X Fan, BL Bhuva, ...
2017 IEEE International Reliability Physics Symposium (IRPS), 3D-3.1-3D-3.4, 2017
112017
SE performance of a Schmitt-trigger-based D-flip-flop design in a 16-nm bulk FinFET CMOS process
H Jiang, H Zhang, DR Ball, LW Massengill, BL Bhuva, TR Assis, ...
2016 IEEE International Reliability Physics Symposium (IRPS), 3B-2-1-3B-2-6, 2016
92016
Method, apparatus, and system for automatic and adaptive wireless monitoring and tracking
CL Mai, JF Lee, HQD Lai, D Bugos, H Zhang, B Wang, OCL Au, KJR LIU
US Patent App. 17/019,273, 2020
82020
Power-aware SE analysis of different FF designs at the 14-/16-nm bulk FinFET CMOS technology node
H Jiang, H Zhang, I Chatterjee, JS Kauppila, BL Bhuva, LW Massengill
IEEE Transactions on Nuclear Science 65 (8), 1866-1871, 2018
72018
Method, apparatus, and system for positioning and powering a wireless monitoring system
CL Mai, JF Lee, DN Claffey, H Zhang, HQD Lai, B Wang, OCL Au, KJR Liu
US Patent App. 17/019,271, 2020
62020
Single-event performance of sense-amplifier based flip-flop design in a 16-nm bulk FinFET CMOS process
H Jiang, H Zhang, TR Assis, B Narasimham, BL Bhuva, WT Holman, ...
IEEE Transactions on Nuclear Science 64 (1), 477-482, 2016
52016
Impact of supply voltage and particle LET on the soft error rate of logic circuits
H Jiang, H Zhang, RC Harrington, JA Maharrey, JS Kauppila, ...
2018 IEEE International Reliability Physics Symposium (IRPS), 4C. 4-1-4C. 4-4, 2018
42018
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