Yi-Chun Chen

2018201920202021202220233 3 6 9 39 31

Daniel Stanley TanOpen UniversiteitVerified email at ou.nl
Min SunChief AI Scientist at Appier Inc. and Associate Professor at National Tsing Hua University, EE deptVerified email at ee.nthu.edu.tw
Hou-Ning HuNational Tsing Hua UniversityVerified email at gapp.nthu.edu.tw
Kuo-Hao ZengResearch Scientist, Allen Institute for AIVerified email at allenai.org
Shih-Han ChouThe University of British ColumbiaVerified email at cs.ubc.ca
Jianlong FuMicrosoft ResearchVerified email at microsoft.com
Meng-Li ShihNational Tsing Hua UniversityVerified email at gapp.nthu.edu.tw
Liwei ChanNational Yang Ming Chiao Tung University (NYCU)Verified email at cs.nctu.edu.tw
Cheng SunNational Tsing Hua UniversityVerified email at gapp.nthu.edu.tw
Yu-Jhe LiCarnegie Mellon UniversityVerified email at cs.cmu.edu
Kris KitaniCarnegie Mellon University, Robotics InstituteVerified email at cs.cmu.edu
Jinhyung ParkPhD Student, Carnegie Mellon UniversityVerified email at andrew.cmu.edu

Yi-Chun Chen

Verified email at andrew.cmu.edu - Homepage


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TrustMAE: A noise-resilient defect classification framework using memory-augmented auto-encoders with trust regions DS Tan, YC Chen, TPC Chen, WC Chen Proceedings of the IEEE/CVF Winter Conference on Applications of Computer …, 2021	47	2021
Self-view grounding given a narrated 360 video SH Chou, YC Chen, KH Zeng, HN Hu, J Fu, M Sun Proceedings of the AAAI Conference on Artificial Intelligence 32 (1), 2018	20	2018
DLWV2: A Deep Learning-Based Wearable Vision-System with Vibrotactile-Feedback for Visually Impaired People to Reach Objects ML Shih, YC Chen, CY Tung, C Sun, CJ Cheng, L Chan, S Varadarajan, ... 2018 IEEE/RSJ International Conference on Intelligent Robots and Systems …, 2018	12	2018
Demystifying data and AI for manufacturing: case studies from a major computer maker YC Chen, BH He, SS Lin, JH Soeseno, DS Tan, TPC Chen, WC Chen APSIPA Transactions on Signal and Information Processing 10, e4, 2021	6	2021
Crack Detection and Refinement Via Deep Reinforcement Learning J Park, YC Chen, YJ Li, K Kitani 2021 IEEE International Conference on Image Processing (ICIP), 529-533, 2021	5	2021
Method for labeling image YC Chen, TPC Chen, DSY Tan, WC Chen US Patent 11,176,419, 2021	1	2021
Method for training defect detector YC Chen, TPC Chen, DSY Tan, WC Chen US Patent 11,315,229, 2022		2022

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