| A two-phase transfer learning model for cross-project defect prediction C Liu, D Yang, X Xia, M Yan, X Zhang Information and Software Technology 107, 125-136, 2019 | 145 | 2019 |
| Improving Code Search with Co-Attentive Representation Learning J Shuai, L Xu, C Liu, M Yan, X Xia, Y Lei Proceedings of the 28th International Conference on Program Comprehension …, 2020 | 119 | 2020 |
| File-level defect prediction: Unsupervised vs. supervised models M Yan, Y Fang, D Lo, X Xia, X Zhang Empirical Software Engineering and Measurement (ESEM), 2017 ACM/IEEE …, 2017 | 98 | 2017 |
| Automated classification of software change messages by semi-supervised Latent Dirichlet Allocation Y Fu, M Yan, X Zhang, L Xu, D Yang, JD Kymer Information and Software Technology 57, 369-377, 2015 | 88 | 2015 |
| Just-in-time defect identification and localization: A two-phase framework M Yan, X Xia, Y Fan, AE Hassan, D Lo, S Li IEEE Transactions on Software Engineering 48 (1), 82-101, 2020 | 86 | 2020 |
| Automating change-level self-admitted technical debt determination M Yan, X Xia, E Shihab, D Lo, J Yin, X Yang IEEE Transactions on Software Engineering 45 (12), 1211-1229, 2018 | 86 | 2018 |
| Duplicate Bug Report Detection Using Dual-Channel Convolutional Neural Networks J He, L Xu, M Yan, X Xia, Y Lei Proceedings of the 28th International Conference on Program Comprehension …, 2020 | 83 | 2020 |
| Improving ChatGPT Prompt for Code Generation C Liu, X Bao, H Zhang, N Zhang, H Hu, X Zhang, M Yan arXiv preprint arXiv:2305.08360, 2023 | 78 | 2023 |
| Which non-functional requirements do developers focus on? an empirical study on stack overflow using topic analysis J Zou, L Xu, W Guo, M Yan, D Yang, X Zhang 2015 IEEE/ACM 12th Working Conference on Mining Software Repositories, 446-449, 2015 | 67 | 2015 |
| Automatically classifying software changes via discriminative topic model: Supporting multi-category and cross-project M Yan, Y Fu, X Zhang, D Yang, L Xu, JD Kymer Journal of Systems and Software 113, 296-308, 2016 | 60 | 2016 |
| Two-Stage Attention-Based Model for Code Search with Textual and Structural Features L Xu, H Yang, C Liu, J Shuai, M Yan, Y Lei, Z Xu 2021 IEEE International Conference on Software Analysis, Evolution and …, 2021 | 58 | 2021 |
| A comprehensive comparative study of clustering-based unsupervised defect prediction models Z Xu, L Li, M Yan, J Liu, X Luo, J Grundy, Y Zhang, X Zhang Journal of Systems and Software 172, 110862, 2021 | 55 | 2021 |
| Automating just-in-time comment updating Z Liu, X Xia, M Yan, S Li Proceedings of the 35th IEEE/ACM International Conference on Automated …, 2020 | 54 | 2020 |
| DeepScaling: microservices autoscaling for stable CPU utilization in large scale cloud systems Z Wang, S Zhu, J Li, W Jiang, KK Ramakrishnan, Y Zheng, M Yan, ... Proceedings of the 13th Symposium on Cloud Computing, 16-30, 2022 | 49 | 2022 |
| A study of effectiveness of deep learning in locating real faults Z Zhang, Y Lei, X Mao, M Yan, L Xu, X Zhang Information and Software Technology 131, 106486, 2021 | 48 | 2021 |
| Reentrancy vulnerability detection and localization: A deep learning based two-phase approach Z Zhang, Y Lei, M Yan, Y Yu, J Chen, S Wang, X Mao Proceedings of the 37th IEEE/ACM International Conference on Automated …, 2022 | 47 | 2022 |
| Simplified Deep Forest Model based Just-In-Time Defect Prediction for Android Mobile Apps K Zhao, Z Xu, T Zhang, Y Tang, M Yan IEEE Transactions on Reliability, 2021 | 42 | 2021 |
| Software quality assessment model: a systematic mapping study M YAN, X XIA, X ZHANG, L XU, D YANG, S LI SCIENCE CHINA Information Sciences 62 (191101), 1-191101, 2019 | 41 | 2019 |
| A component recommender for bug reports using Discriminative Probability Latent Semantic Analysis M Yan, X Zhang, D Yang, L Xu, JD Kymer Information and Software Technology 73, 37-51, 2016 | 41 | 2016 |
| A universal data augmentation approach for fault localization H Xie, Y Lei, M Yan, Y Yu, X Xia, X Mao Proceedings of the 44th International Conference on Software Engineering, 48-60, 2022 | 37 | 2022 |
Xin XiaChief Expert of the Software Engineering Application Technology, Huawei Technologies, ChinaVerified email at acm.org
