Signature of Superfluid Density in the Single-Particle Excitation Spectrum of Bi2 Sr2 CaCu2 O8+δ DL Feng, DH Lu, KM Shen, C Kim, H Eisaki, A Damascelli, R Yoshizaki, ...
Science 289 (5477), 277-281, 2000
347 2000 Magnetoelastic coupling and magnetic anisotropy in films J O’Donnell, MS Rzchowski, JN Eckstein, I Bozovic
Applied Physics Letters 72 (14), 1775-1777, 1998
179 1998 Anisotropic magnetoresistance in tetragonal La1−x Cax MnOδ thin films JN Eckstein, I Bozovic, J O’Donnell, M Onellion, MS Rzchowski
Applied physics letters 69 (9), 1312-1314, 1996
155 1996 MRAM as embedded non-volatile memory solution for 22FFL FinFET technology O Golonzka, JG Alzate, U Arslan, M Bohr, P Bai, J Brockman, B Buford, ...
2018 IEEE International Electron Devices Meeting (IEDM), 18.1. 1-18.1. 4, 2018
146 2018 Nodal Quasiparticle Lifetime in the Superconducting State of J Corson, J Orenstein, S Oh, J O'Donnell, JN Eckstein
Physical review letters 85 (12), 2569, 2000
143 2000 13.3 a 7mb stt-mram in 22ffl finfet technology with 4ns read sensing time at 0.9 v using write-verify-write scheme and offset-cancellation sensing technique L Wei, JG Alzate, U Arslan, J Brockman, N Das, K Fischer, T Ghani, ...
2019 IEEE International Solid-State Circuits Conference-(ISSCC), 214-216, 2019
130 2019 Magnetoresistance scaling in MBE-grown Mn thin films J O'donnell, M Onellion, MS Rzchowski, JN Eckstein, I Bozovic
Physical Review B 54 (10), R6841, 1996
127 1996 Mesoscopic thermodynamics of an inhomogeneous colossal-magnetoresistive phase RD Merithew, MB Weissman, FM Hess, P Spradling, ER Nowak, ...
Physical review letters 84 (15), 3442, 2000
126 2000 Colossal magnetoresistance magnetic tunnel junctions grown by molecular-beam epitaxy J O’donnell, AE Andrus, S Oh, EV Colla, JN Eckstein
Applied Physics Letters 76 (14), 1914-1916, 2000
116 2000 Low-field magnetoresistance in tetragonal sfilms J O'Donnell, M Onellion, MS Rzchowski, JN Eckstein, I Bozovic
Physical Review B 55 (9), 5873, 1997
96 1997 Temperature and magnetic field dependent transport anisotropies in films J O’Donnell, JN Eckstein, MS Rzchowski
Applied Physics Letters 76 (2), 218-220, 2000
93 2000 Non-volatile RRAM embedded into 22FFL FinFET technology O Golonzka, U Arslan, P Bai, M Bohr, O Baykan, Y Chang, A Chaudhari, ...
2019 Symposium on VLSI Technology, T230-T231, 2019
65 2019 Anisotropic properties of molecular beam epitaxy-grown colossal magnetoresistance manganite thin films J O’Donnell, M Onellion, MS Rzchowski, I Eckstein, J. N., Bozovic
Journal of Applied Physics 81 (8), 4961-4963, 1997
30 1997 Characterization of SILC and its end-of-life reliability assessment on 45nm high-K and metal-gate technology S Pae, T Ghani, M Hattendorf, J Hicks, J Jopling, J Maiz, K Mistry, ...
2009 IEEE International Reliability Physics Symposium, 499-504, 2009
18 2009 eNVM RRAM reliability performance and modeling in 22FFL FinFET technology YF Chang, JA O'Donnell, T Acosta, R Kotlyar, A Chen, PA Quintero, ...
2020 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2020
12 2020 Rheed Studies of a-Axis Oriented DyBa2Cu3O7 Films Grown by All-MBE I Bozovic, JN Eckstein, N Bozovic, J O'Donnell
MRS Online Proceedings Library (OPL) 502, 221, 1997
8 1997 Embedded emerging memory technologies for neuromorphic computing: Temperature instability and reliability YF Chang, I Karpov, R Hopkins, D Janosky, J Medeiros, B Sherrill, ...
2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021
7 2021 On the similarity of the spectral weight pattern of Bi2Sr2CaCuO8+ δ and La1. 48Nd0. 4Sr0. 12CuO4 DL Feng, DH Lu, KM Shen, S Oh, A Andrus, J O'Donnell, JN Eckstein, ...
Physica C: Superconductivity 341, 2097-2098, 2000
7 2000 eNVM MRAM retention reliability modeling in 22FFL FinFET technology JA O'Donnell, C Connor, T Pramanik, J Hicks, JG Alzate, F Hamzaoglu, ...
2019 IEEE International Reliability Physics Symposium (IRPS), 1-3, 2019
5 2019 Defect scattering in high Tc and colossal magnetoresistive tunnel junctions JN Eckstein, J O'Donnell, S Oh, AE Andrus, M Warusawathana, E Bertram, ...
Physica C: Superconductivity 335 (1-4), 184-189, 2000
5 2000