| Machine learning for electronic design automation: A survey G Huang, J Hu, Y He, J Liu, M Ma, Z Shen, J Wu, Y Xu, H Zhang, K Zhong, ... ACM Transactions on Design Automation of Electronic Systems (TODAES) 26 (5 …, 2021 | 302 | 2021 |
| GAN-OPC: Mask optimization with lithography-guided generative adversarial nets H Yang, S Li, Y Ma, B Yu, EFY Young Proceedings of the 55th Annual Design Automation Conference, 1-6, 2018 | 190 | 2018 |
| Layout hotspot detection with feature tensor generation and deep biased learning H Yang, J Su, Y Zou, B Yu, EFY Young Proceedings of the 54th Annual Design Automation Conference 2017, 1-6, 2017 | 168 | 2017 |
| Imbalance aware lithography hotspot detection: a deep learning approach H Yang, L Luo, J Su, C Lin, B Yu Journal of Micro/Nanolithography, MEMS, and MOEMS 16 (3), 033504-033504, 2017 | 128 | 2017 |
| Faster region-based hotspot detection R Chen, W Zhong, H Yang, H Geng, X Zeng, B Yu Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 65 | 2019 |
| DAMO: Deep agile mask optimization for full chip scale G Chen, W Chen, Y Ma, H Yang, B Yu Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020 | 64 | 2020 |
| Lithography hotspot detection: From shallow to deep learning H Yang, Y Lin, B Yu, EFY Young 2017 30th IEEE International System-on-Chip Conference (SOCC), 233-238, 2017 | 57 | 2017 |
| Hotspot detection via attention-based deep layout metric learning H Geng, H Yang, L Zhang, J Miao, F Yang, X Zeng, B Yu Proceedings of the 39th International Conference on Computer-Aided Design, 1-8, 2020 | 44 | 2020 |
| DeePattern: Layout pattern generation with transforming convolutional auto-encoder H Yang, P Pathak, F Gennari, YC Lai, B Yu Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 41 | 2019 |
| SRAF insertion via supervised dictionary learning H Geng, H Yang, Y Ma, J Mitra, B Yu Proceedings of the 24th Asia and South Pacific Design Automation Conference …, 2019 | 40 | 2019 |
| Adversarial perturbation attacks on ML-based CAD: A case study on CNN-based lithographic hotspot detection K Liu, H Yang, Y Ma, B Tan, B Yu, EFY Young, R Karri, S Garg ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (5 …, 2020 | 38 | 2020 |
| Detecting multi-layer layout hotspots with adaptive squish patterns H Yang, P Pathak, F Gennari, YC Lai, B Yu Proceedings of the 24th Asia and South Pacific Design Automation Conference …, 2019 | 35 | 2019 |
| Graph learning-based arithmetic block identification Z He, Z Wang, C Bai, H Yang, B Yu 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 1-8, 2021 | 33 | 2021 |
| Generic lithography modeling with dual-band optics-inspired neural networks H Yang, Z Li, K Sastry, S Mukhopadhyay, M Kilgard, A Anandkumar, ... Proceedings of the 59th ACM/IEEE Design Automation Conference, 973-978, 2022 | 29 | 2022 |
| Attacking split manufacturing from a deep learning perspective H Li, S Patnaik, A Sengupta, H Yang, J Knechtel, B Yu, EFY Young, ... Proceedings of the 56th Annual Design Automation Conference 2019, 1-6, 2019 | 29 | 2019 |
| Deep learning-driven simultaneous layout decomposition and mask optimization W Zhong, S Hu, Y Ma, H Yang, X Ma, B Yu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021 | 26 | 2021 |
| VLSI mask optimization: From shallow to deep learning H Yang, W Zhong, Y Ma, H Geng, R Chen, W Chen, B Yu Integration 77, 96-103, 2021 | 25 | 2021 |
| Bridging the Gap Between Layout Pattern Sampling and Hotspot Detection via Batch Active Learning H Yang, S Li, C Tabery, B Lin, B Yu arXiv preprint arXiv:1807.06446, 2018 | 22 | 2018 |
| Attentional transfer is all you need: Technology-aware layout pattern generation X Zhang, H Yang, EFY Young 2021 58th ACM/IEEE Design Automation Conference (DAC), 169-174, 2021 | 17 | 2021 |
| Lithobench: Benchmarking ai computational lithography for semiconductor manufacturing S Zheng, H Yang, B Zhu, B Yu, M Wong Advances in Neural Information Processing Systems 36, 30243-30254, 2023 | 16 | 2023 |
Bei YuThe Chinese University of Hong KongVahvistettu sähköpostiosoite verkkotunnuksessa cse.cuhk.edu.hk
