Hardware Trojan detection using path delay fingerprint Y Jin, Y Makris 2008 IEEE International workshop on hardware-oriented security and trust, 51-57, 2008 | 863 | 2008 |
Counterfeit integrated circuits: A rising threat in the global semiconductor supply chain U Guin, K Huang, D DiMase, JM Carulli, M Tehranipoor, Y Makris Proceedings of the IEEE 102 (8), 1207-1228, 2014 | 687 | 2014 |
Experiences in hardware Trojan design and implementation Y Jin, N Kupp, Y Makris 2009 IEEE international workshop on hardware-oriented security and trust, 50-57, 2009 | 317 | 2009 |
Proof-carrying hardware intellectual property: A pathway to trusted module acquisition E Love, Y Jin, Y Makris IEEE Transactions on Information Forensics and Security 7 (1), 25-40, 2011 | 205 | 2011 |
Hardware Trojans in wireless cryptographic ICs Y Jin, Y Makris IEEE Design & Test of Computers 27 (1), 26-35, 2010 | 161 | 2010 |
Error moderation in low-cost machine-learning-based analog/RF testing HG Stratigopoulos, Y Makris IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008 | 161 | 2008 |
What to lock? Functional and parametric locking M Yasin, A Sengupta, BC Schafer, Y Makris, O Sinanoglu, J Rajendran Proceedings of the on Great Lakes Symposium on VLSI 2017, 351-356, 2017 | 153 | 2017 |
Hardware Trojan detection through golden chip-free statistical side-channel fingerprinting Y Liu, K Huang, Y Makris Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014 | 147 | 2014 |
Silicon demonstration of hardware Trojan design and detection in wireless cryptographic ICs Y Liu, Y Jin, A Nosratinia, Y Makris IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (4 …, 2016 | 122 | 2016 |
Parametric counterfeit IC detection via support vector machines K Huang, JM Carulli, Y Makris 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012 | 105 | 2012 |
Non-RF to RF test correlation using learning machines: A case study HGD Stratigopoulos, P Drineas, M Slamani, Y Makris 25th IEEE VLSI Test Symposium (VTS'07), 9-14, 2007 | 97 | 2007 |
Proof carrying-based information flow tracking for data secrecy protection and hardware trust Y Jin, Y Makris 2012 IEEE 30th VLSI Test Symposium (VTS), 252-257, 2012 | 94 | 2012 |
Instruction-level impact analysis of low-level faults in a modern microprocessor controller M Maniatakos, N Karimi, C Tirumurti, A Jas, Y Makris IEEE Transactions on Computers 60 (9), 1260-1273, 2010 | 89 | 2010 |
Hardware Trojans in wireless cryptographic ICs: silicon demonstration & detection method evaluation Y Liu, Y Jin, Y Makris 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 399-404, 2013 | 80 | 2013 |
Soft error mitigation through selective addition of functionally redundant wires S Almukhaizim, Y Makris IEEE Transactions on Reliability 57 (1), 23-31, 2008 | 80 | 2008 |
Nonlinear decision boundaries for testing analog circuits HGD Stratigopoulos, Y Makris IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2005 | 79 | 2005 |
RF specification test compaction using learning machines HG Stratigopoulos, P Drineas, M Slamani, Y Makris IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18 (6), 998 …, 2009 | 77 | 2009 |
Counterfeit electronics: A rising threat in the semiconductor manufacturing industry K Huang, JM Carulli, Y Makris 2013 IEEE International Test Conference (ITC), 1-4, 2013 | 75 | 2013 |
Post-deployment trust evaluation in wireless cryptographic ICs Y Jin, D Maliuk, Y Makris 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), 965-970, 2012 | 73 | 2012 |
Recycled IC detection based on statistical methods K Huang, Y Liu, N Korolija, JM Carulli, Y Makris IEEE transactions on computer-aided design of integrated circuits and …, 2015 | 68 | 2015 |