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Nano letters 19 (1), 38-45, 2018
25 2018 TVS devices transient behavior modeling framework and application to Seed L Shen, S Marathe, J Meiguni, G Luo, J Zhou, D Pommerenke
2019 41st Annual EOS/ESD Symposium (EOS/ESD), 1-10, 2019
15 2019 Detection of ESD-Induced Soft Failures by Analyzing Linux Kernel Function Calls X Liu, G Maghlakelidze, J Zhou, OH Izadi, L Shen, M Pommerenke, SS Ge, ...
IEEE Transactions on Device and Materials Reliability 20 (1), 128-135, 2020
9 2020 Robust Extended Unterminated Line (EUL) Crosstalk Characterization Techniques for High-Speed Interconnect Y Guo, DH Kim, J He, X Ye, A Sutono, V Kunda, A Luoh, Z Kiguradze, ...
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2020
8 2020 Andreev Reflection Spectroscopy of Topological Superconductor Candidate Nb Bi Se C Kurter, A Finck, E Huemiller, J Medvedeva, A Weis, J Atkinson, Y Qiu, ...
arXiv preprint arXiv:1707.08516, 2017
6 2017 Investigations into Methods to Stabilize the Spark in Air Discharge ESD J Zhou, K Zhou, X Yan, L Shen, D Pommerenke, G Luo
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal …, 2019
4 2019 IC Pin Modeling and Mitigation of ESD-Induced Soft Failures G Maghlakelidze, L Shen, H Gossner, D Pommerenke, D Kim
IEEE Transactions on Electromagnetic Compatibility, 2020
1 2020