On the modeling of a piezoelectrically actuated microsensor for simultaneous measurement of fluids viscosity and density G Rezazadeh, M Ghanbari, I Mirzaee, A Keyvani Measurement 43 (10), 1516-1524, 2010 | 34 | 2010 |
Pull-in phenomena and dynamic response of a capacitive nano-beam switch F Vakili-Tahami, H Mobki, AA Keyvani-Janbahan, G Rezazadeh Sensors & Transducers 110 (11), 26, 2009 | 34 | 2009 |
Nonlinear behavior of a nano-scale beam considering length scale-parameter H Mobki, MH Sadeghi, G Rezazadeh, M Fathalilou, A Keyvani Applied Mathematical Modelling 38 (5-6), 1881-1895, 2014 | 30 | 2014 |
On a MEMS based dynamic remote temperature sensor using transverse vibration of a bi-layer micro-cantilever G Rezazadeh, A Keyvani, S Jafarmadar Measurement 45 (3), 580-589, 2012 | 27 | 2012 |
Minimizing tip-sample forces and enhancing sensitivity in atomic force microscopy with dynamically compliant cantilevers A Keyvani, H Sadeghian, MS Tamer, JFL Goosen, F van Keulen Journal of Applied Physics 121 (24), 2017 | 22 | 2017 |
Simultaneous AFM nano-patterning and imaging for photomask repair A Keyvani, MS Tamer, MH van Es, H Sadeghian Metrology, Inspection, and Process Control for Microlithography XXX 9778 …, 2016 | 11 | 2016 |
Transient tip-sample interactions in high-speed AFM imaging of 3D nano structures A Keyvani, H Sadeghian, H Goosen, F van Keulen Metrology, Inspection, and Process Control for Microlithography XXIX 9424 …, 2015 | 8 | 2015 |
A comprehensive model for transient behavior of tapping mode atomic force microscope A Keyvani, MS Tamer, JW van Wingerden, JFL Goosen, F van Keulen Nonlinear Dynamics 97, 1601-1617, 2019 | 7 | 2019 |
Chaos: the speed limiting phenomenon in dynamic atomic force microscopy A Keyvani, F Alijani, H Sadeghian, K Maturova, H Goosen, F Van Keulen Journal of Applied Physics 122 (22), 2017 | 7 | 2017 |
Modeling of a bio sensor based on detection of antigens concentration using an electrically actuated micro cantilever H Madinei, AA Keyvani-Janbahan, M Atashparva, R Shabani, ... Sensors & Transducers 125 (2), 238, 2011 | 6 | 2011 |
On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy A Keyvani, H Sadeghian, H Goosen, F Van Keulen Applied Physics Letters 112 (16), 2018 | 4 | 2018 |
Quantitative measurement of tip-sample interaction forces in tapping mode atomic force microscopy S Tamer, HS Marnani, SK Janbahan, H Goosen, F van Keulen 13th International Workshop on Nanomechanical Sensing, 2016 | 4 | 2016 |
Method of performing surface measurements on a surface of a sample, and scanning probe microscopy system therefore HS Marnani, AK Janbahan US Patent 10,697,998, 2020 | 3 | 2020 |
Real-time estimation of the tip-sample interactions in tapping mode atomic force microscopy with a regularized Kalman filter A Keyvani, G van der Veen, MS Tamer, H Sadeghian, H Goosen, ... IEEE Transactions on Nanotechnology 19, 274-283, 2020 | 3 | 2020 |
Effects of ohmic resistance on dynamic characteristics and impedance of micro/nano cantilever beam resonators G Rezazadeh, A Keyvani, MH Sadeghi, M Bahrami Sensing and Imaging: An International Journal 14, 1-12, 2013 | 3 | 2013 |
Effects of squeeze film damping on a clamped-clamped beam MEMS filter A Keyvani, MH Sadeghi, G Rezazadeh, M Bahrami Journal of Micro-Bio Robotics 8, 83-90, 2013 | 3 | 2013 |
First results from the large dynamic range atomic force microscope for overlay metrology G Witvoet, J Peters, S Kuiper, S Keyvani, R Willekers Metrology, Inspection, and Process Control for Microlithography XXXIII 10959 …, 2019 | 2 | 2019 |
Investigation of squeeze film effect on dynamic characteristics of electrically actuated fully clamped micro-beam AAK Janbahan, A Ghanbari, J Keyghobadi Sensors & Transducers 123 (12), 41, 2010 | 2 | 2010 |
Method of modifying a surface of a sample, and a scanning probe microscopy system HS Marnani, AK Janbahan, MS Tamer, K Maturova US Patent App. 16/347,922, 2019 | 1 | 2019 |
Improved sub-surface AFM using photothermal actuation ME Reijzen, MS Tamer, MH Es, M Riel, A Keyvani, H Sadeghian, ... Metrology, Inspection, and Process Control for Microlithography XXXIII 10959 …, 2019 | 1 | 2019 |