Juha Reunanen
Juha Reunanen
Independent Consultant
Verified email at tomaattinen.com - Homepage
Title
Cited by
Cited by
Year
Overfitting in making comparisons between variable selection methods
J Reunanen
Journal of Machine Learning Research 3, 1371-1382, 2003
6082003
Search strategies
J Reunanen
Feature Extraction – Foundations and Applications, 119-136, 2006
242006
A pitfall in determining the optimal feature subset size
J Reunanen
4th International Workshop on Pattern Recognition in Information Systems†…, 2004
232004
Model selection and assessment using cross-indexing
J Reunanen
International Joint Conference on Neural Networks (IJCNN) 2007, 2581-2585, 2007
132007
Method and apparatus for recognizing repeating patterns
J Reunanen, A Saarela
EP Patent 1,867,979, 2009
12*2009
Retrieval of aerosol optical depth from surface solar radiation measurements using machine learning algorithms, non-linear regression and a radiative transfer-based look-up table
J Huttunen, H Kokkola, T Mielonen, MEJ Mononen, A Lipponen, ...
Atmospheric Chemistry and Physics 16 (13), 8181-8191, 2016
112016
Less biased measurement of feature selection benefits
J Reunanen
Subspace, Latent Structure and Feature Selection, 198-208, 2006
82006
Overfitting in feature selection: Pitfalls and solutions
J Reunanen
Aalto University, School of Science, 2012
52012
Facilitating anomaly detection for a product having a pattern
J Reunanen
US Patent 10,043,259, 2018
42018
Machine learning approach for locating phase interfaces using conductivity probes
J Reunanen, M Mononen, M Vauhkonen, A Lehikoinen, JP Kaipio
Inverse Problems in Science and Engineering 19 (6), 879-902, 2011
32011
Probe indicating intermaterial boundaries
J Kaipio, M Vauhkonen, J Reunanen, A Lehikoinen
US Patent 9,182,264, 2011
1*2011
Image analysis in pathology
J Reunanen, LM Keinšnen, T Ropponen
US Patent 10,803,586, 2020
2020
Fair exponential smoothing with small alpha
J Reunanen
https://github.com/reunanen/fessa/raw/master/fessa.pdf, 2015
2015
Method and product for creating rules
J Reunanen, A Saarela
FI Patent 120,806, 2006
2006
Feynman's Quantum Computer Modeled Using Petri Nets: Full Adder Circuit
L Ojala, H Rantanen, E Parviainen, OM Penttinen, J Reunanen
7th World Multiconference on Systemics, Cybernetics and Informatics (SCI†…, 2003
2003
Feynman's Quantum Computer Modeled Using Petri Nets: A Case Study
L Ojala, E Parviainen, OM Penttinen, J Reunanen
6th World Multiconference on Systemics, Cybernetics and Informatics (SCI2002†…, 2002
2002
Feature selection for classification of metal strip surface defects
JS Reunanen
2001
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Articles 1–17