VLSI test principles and architectures: design for testability LT Wang, CW Wu, X Wen
Elsevier, 2006
970 2006 Electronic design automation: synthesis, verification, and test LT Wang, YW Chang, KTT Cheng
Morgan Kaufmann, 2009
350 2009 Testing for resistive opens and stuck opens JCM Li, CW Tseng, EJ McCluskey
Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 1049-1058, 2001
195 2001 A secure test wrapper design against internal and boundary scan attacks for embedded cores GM Chiu, JCM Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (1), 126-134, 2010
98 2010 Survey of scan chain diagnosis Y Huang, R Guo, WT Cheng, JCM Li
IEEE Design & Test of Computers 25 (3), 240-248, 2008
98 2008 Diagnosis of sequence-dependent chips JCM Li, EJ McCluskey
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 187-192, 2002
75 2002 ELF-Murphy data on defects and tests sets EJ McCluskey, A Al-Yamani, JCM Li, CW Tseng, E Volkerink, FF Ferhani, ...
22nd IEEE VLSI Test Symposium, 2004. Proceedings., 16-22, 2004
74 2004 Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs JCM Li, EJ McCluskey
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2005
65 2005 Jump scan: A DFT technique for low power testing MH Chiu, JCM Li
23rd IEEE VLSI Test Symposium (VTS'05), 277-282, 2005
54 2005 Diagnosis of single stuck-at faults and multiple timing faults in scan chains JCM Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (6), 708-718, 2005
53 2005 Jump simulation: A technique for fast and precise scan chain fault diagnosis YL Kao, WS Chuang, JCM Li
2006 IEEE International Test Conference, 1-9, 2006
48 2006 Testing for tunneling opens JCM Li, EJ McCluskey
Proceedings International Test Conference 2000 (IEEE Cat. No. 00CH37159), 85-94, 2000
43 2000 Diagnosis of multiple hold-time and setup-time faults in scan chains JCM Li
IEEE Transactions on Computers 54 (11), 1467-1472, 2005
42 2005 Testing of TSV-induced small delay faults for 3-D integrated circuits CY Kuo, CJ Shih, YC Lu, JCM Li, K Chakrabarty
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (3), 667-674, 2013
25 2013 ELF35 experiment-Chip and experiment design JCM Li, JTY Chang, CW Tseng, EJ McCluskey
Center for Reliable Computing, Stanford Univ., CA, CRC Tech. Rep, 1999
20 1999 IDDQ data analysis using current signature JCM Li, EJ McCluskey
Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No …, 1998
16 1998 Effect of histidine on myocardial mitochondria and platelet aggregation during thrombotic cerebral ischemia in rats. SQ Li, G Zhao, J Li, W Qian
Zhongguo yao li xue bao= Acta Pharmacologica Sinica 19 (5), 493-496, 1998
16 1998 GPU-based N-detect transition fault ATPG KY Liao, SC Hsu, JCM Li
Proceedings of the 50th Annual Design Automation Conference, 1-8, 2013
15 2013 Evidence for the Direct Two-Photon Transition from to M Ablikim, MN Achasov, DJ Ambrose, FF An, Q An, ZH An, JZ Bai, ...
Physical review letters 109 (17), 172002, 2012
15 2012 3D IC test scheduling using simulated annealing CY Hsu, CY Kuo, JCM Li, K Chakrabarty
Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, 1-4, 2012
14 2012