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Vipindas Pala
Vipindas Pala
LogiSiC Devices
Vahvistettu sähköpostiosoite verkkotunnuksessa logisicdevices.com - Kotisivu
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Silicon carbide power MOSFETs: Breakthrough performance from 900 V up to 15 kV
JW Palmour, L Cheng, V Pala, EV Brunt, DJ Lichtenwalner, GY Wang, ...
2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014
3202014
10 kV and 15 kV silicon carbide power MOSFETs for next-generation energy conversion and transmission systems
V Pala, EV Brunt, L Cheng, M O'Loughlin, J Richmond, A Burk, ST Allen, ...
2014 IEEE Energy Conversion Congress and Exposition (ECCE), 449-454, 2014
1592014
Smart power devices and ICs using GaAs and wide and extreme bandgap semiconductors
TP Chow, I Omura, M Higashiwaki, H Kawarada, V Pala
IEEE Transactions on Electron Devices 64 (3), 856-873, 2017
1532017
27 kV, 20 A 4H-SiC n-IGBTs
E Van Brunt, L Cheng, MJ O'Loughlin, J Richmond, V Pala, JW Palmour, ...
Materials Science Forum 821, 847-850, 2015
1342015
New generation 10kV SiC power MOSFET and diodes for industrial applications
JB Casady, V Pala, DJ Lichtenwalner, E Van Brunt, B Hull, GY Wang, ...
Proceedings of PCIM Europe 2015; International Exhibition and Conference for …, 2015
1252015
Reliability and stability of SiC power mosfets and next-generation SiC MOSFETs
B Hull, S Allen, Q Zhang, D Gajewski, V Pala, J Richmond, S Ryu, ...
2014 IEEE Workshop on Wide Bandgap Power Devices and Applications, 139-142, 2014
932014
22 kV, 1 cm2, 4H-SiC n-IGBTs with improved conductivity modulation
EV Brunt, L Cheng, M O'Loughlin, C Capell, C Jonas, K Lam, J Richmond, ...
2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014
922014
Integrated high-frequency power converters based on GaAs pHEMT: Technology characterization and design examples
V Pala, H Peng, P Wright, MM Hella, TP Chow
IEEE Transactions on Power Electronics 27 (5), 2644-2656, 2011
692011
Ultra high voltage MOS controlled 4H-SiC power switching devices
S Ryu, C Capell, E Van Brunt, C Jonas, M O’Loughlin, J Clayton, K Lam, ...
Semiconductor Science and Technology 30 (8), 084001, 2015
452015
27 kV 20 A 4H-SiC n-IGBTs
EV Brunt, L Cheng, MJ O’Loughlin, J Richmond, V Pala, J Palmour, ...
Mater. Sci. Forum 821, 847-850, 2015
452015
Controlled ion implantation into silicon carbide using channeling and devices fabricated using controlled ion implantation into silicon carbide using channeling
AV Suvorov, V Pala
US Patent 9,768,259, 2017
392017
Field effect transistor devices with buried well protection regions
L Cheng, A Agarwal, V Pala, J Palmour
US Patent 9,142,668, 2015
372015
Physics of bipolar, unipolar and intermediate conduction modes in Silicon Carbide MOSFET body diodes
V Pala, E Van Brunt, SH Ryu, B Hull, S Allen, J Palmour, A Hefner
2016 28th International Symposium on Power Semiconductor Devices and ICs …, 2016
322016
Strategic overview of high-voltage SiC power device development aiming at global energy savings
L Cheng, JW Palmour, AK Agarwal, ST Allen, EV Brunt, GY Wang, V Pala, ...
Materials Science Forum 778, 1089-1095, 2014
312014
Record-low 10mΩ SiC MOSFETs in TO-247, rated at 900V
V Pala, G Wang, B Hull, S Allen, J Casady, J Palmour
2016 IEEE Applied Power Electronics Conference and Exposition (APEC), 979-982, 2016
282016
Field effect device with enhanced gate dielectric structure
DJ Lichtenwalner, AK Agarwal, L Cheng, V Pala, JW Palmour
US Patent 9,111,919, 2015
262015
Monolithically integrated vertical power transistor and bypass diode
V Pala, L Cheng, AK Agarwal, JW Palmour, ER Van Brunt
US Patent 10,868,169, 2020
242020
High-mobility SiC MOSFETs with alkaline earth interface passivation
DJ Lichtenwalner, V Pala, B Hull, S Allen, JW Palmour
Materials Science Forum 858, 671-676, 2016
242016
Avalanche breakdown design parameters in GaN
Z Li, V Pala, TP Chow
Japanese Journal of Applied Physics 52 (8S), 08JN05, 2013
222013
900V silicon carbide MOSFETs for breakthrough power supply design
V Pala, A Barkley, B Hull, G Wang, SH Ryu, E Van Brunt, D Lichtenwalner, ...
2015 IEEE Energy Conversion Congress and Exposition (ECCE), 4145-4150, 2015
202015
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