| Defect filter for alternate RF test HG Stratigopoulos, S Mir, E Acar, S Ozev 2010 15th IEEE European Test Symposium, 265-270, 2010 | 103 | 2010 |
| Evaluation of analog/RF test measurements at the design stage HG Stratigopoulos, S Mir, A Bounceur IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009 | 72 | 2009 |
| Estimation of test metrics for the optimisation of analogue circuit testing A Bounceur, S Mir, E Simeu, L Rolíndez Journal of Electronic Testing 23, 471-484, 2007 | 68 | 2007 |
| Adaptive alternate analog test HG Stratigopoulos, S Mir IEEE Design & Test of Computers 29 (4), 71-79, 2012 | 67 | 2012 |
| Generation of electrically induced stimuli for MEMS self-test B Charlot, S Mir, F Parrain, B Courtois Journal of electronic testing 17, 459-470, 2001 | 66 | 2001 |
| Sensors for built-in alternate RF test L Abdallah, HG Stratigopoulos, C Kelma, S Mir 2010 15th IEEE European Test Symposium, 49-54, 2010 | 65 | 2010 |
| Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets S Mir, M Lubaszewski, B Courtois Journal of Electronic Testing 9, 43-57, 1996 | 65 | 1996 |
| Fault diagnosis of analog circuits based on machine learning K Huang, HG Stratigopoulos, S Mir 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010 | 62 | 2010 |
| Electrically induced stimuli for MEMS self-test B Charlot, S Mir, F Parrain, B Courtois Proceedings 19th IEEE VLSI Test Symposium. VTS 2001, 210-215, 2001 | 61 | 2001 |
| Diagnosis of local spot defects in analog circuits K Huang, HG Stratigopoulos, S Mir, C Hora, Y Xing, B Kruseman IEEE Transactions on Instrumentation and Measurement 61 (10), 2701-2712, 2012 | 60 | 2012 |
| Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems A Castillejo, D Veychard, S Mir, JM Karam, B Courtois Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998 | 56 | 1998 |
| Design of self-checking fully differential circuits and boards M Lubaszewski, S Mir, V Kolarik, C Nielsen, B Courtois IEEE Transactions on Very Large Scale Integration (VLSI) Systems 8 (2), 113-128, 2000 | 50 | 2000 |
| Built-in-self-test techniques for MEMS S Mir, L Rufer, A Dhayni Microelectronics journal 37 (12), 1591-1597, 2006 | 46 | 2006 |
| Estimation of analog parametric test metrics using copulas A Bounceur, S Mir, HG Stratigopoulos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2011 | 45 | 2011 |
| Unified built-in self-test for fully differential analog circuits S Mir, M Lubaszewski, B Courtois Journal of Electronic Testing 9, 135-151, 1996 | 44 | 1996 |
| Experiences with non-intrusive sensors for RF built-in test L Abdallah, HG Stratigopoulos, S Mir, C Kelma 2012 IEEE International Test Conference, 1-8, 2012 | 43 | 2012 |
| Analog checkers with absolute and relative tolerances V Kolarik, S Mir, M Lubaszewski, B Courtois IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1995 | 42 | 1995 |
| Defect-oriented non-intrusive RF test using on-chip temperature sensors L Abdallah, HG Stratigopoulos, S Mir, J Altet 2013 IEEE 31st VLSI Test Symposium (VTS), 1-6, 2013 | 41 | 2013 |
| Enrichment of limited training sets in machine-learning-based analog/RF test HG Stratigopoulos, S Mir, Y Makris 2009 Design, Automation & Test in Europe Conference & Exhibition, 1668-1673, 2009 | 41 | 2009 |
| Extending fault-based testing to microelectromechanical systems S Mir, B Charlot, B Courtois Journal of Electronic Testing 16, 279-288, 2000 | 40 | 2000 |
