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Yonghyun Kim
Yonghyun Kim
Sr. Engineering Manager, Intel Corporation
Verified email at intel.com
Title
Cited by
Cited by
Year
Ge-SixGe1-xcore-shell nanowire tunneling field-effect transistors
J Nah, Y Kim, ES Liu, KM Varahramyan, SK Banerjee, E Tutuc
68th Device Research Conference, 2010
48*2010
Polarization-isolated electrical modulation of an etched long-period fiber grating with an outer liquid-crystal cladding
Y Jeong, HR Kim, S Baek, Y Kim, YW Lee, SD Lee, B Lee
Optical Engineering 42 (4), 964-968, 2003
222003
Suppression of the cladding mode interference in cascaded long period fiber gratings with liquid crystal claddings
HR Kim, Y Kim, Y Jeong, S Baek, YW Lee, B Lee, SD Lee
Milecular Crystals and Liquid Crystals 413 (1), 399-406, 2004
112004
First-principles studies of small arsenic interstitial complexes in crystalline silicon
Y Kim, TA Kirichenko, N Kong, G Henkelman, SK Banerjee
Physical Review B 79 (7), 075201, 2009
102009
Physically based kinetic Monte Carlo modeling of arsenic-interstitial interaction and arsenic uphill diffusion during ultrashallow junction formation
N Kong, TA Kirichenko, Y Kim, MC Foisy, SK Banerjee
Journal of Applied Physics 104 (1), 2008
72008
Electromagnetic field sensing using liquid crystal optical fibers (Invited Paper)
B Lee, Y Jeong, S Baek, HR Kim, Y Kim, YW Lee, SD Lee
Optical Fiber Sensors Conference Technical Digest, 2002. Ofs 2002, 15th, 403-406, 2002
6*2002
Comprehensive design methodology of extension profile to suppress boron ted in high performance high-k/metal SiGe pMOSFETS
CY Kang, YH Kim, MS Park, JW Oh, BG Min, KS Lee, SK Benerjee, ...
Proc. Int. Conf on Solid State Devices and Materials, 2009
22009
First-principles studies of di-arsenic interstitial and its implications for arsenic-interstitial diffusion in crystalline silicon
Y Kim, TA Kirichenko, N Kong, L Larson, SK Banerjee
Physica B: Condensed Matter 401, 144-147, 2007
22007
Electrical modulation of an etched long-period fiber grating with a liquid-crystal cladding
Y Jeong, HR Kim, S Baek, Y Kim, YW Lee, B Lee, SD Lee
LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society …, 2001
22001
3-D probe: Low-cost variation modeling using intertest-item correlations
J Chung, Y Kim, JS Yang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014
12014
Reliability study of methods to suppress boron transient enhanced diffusion in high-k/metal gate Si/SiGe channel pMOSFETs
MS Park, Y Kim, KT Lee, CY Kang, BG Min, J Oh, P Majhi, HH Tseng, ...
Microelectronic engineering 112, 80-83, 2013
12013
Predicting the Silent Data Error Prone Devices Using Machine Learning
ME Shaik, AK Mishra, Y Kim
2023 IEEE 41th VLSI Test Symposium (VTS), San Diego, CA, USA, 2023
2023
HVM test strategy, BKM, and Si learnings in LDO’s from Intel’s SOC and PCH Products
Y Kim, SH Yong, A Aravindhan, JA Hernandez, SJ Hong
Design and Test Technology Conference, Intel Corporation, 2019
2019
Analog/Mixed Signal IP DFx from a Foundry Perspective
YK Salem Abdennadher, Arani Sinha
24th European Test Symposium (ETS19), 2019
2019
Analog/Mixed Signal IP DFx from a Foundry Perspective
YK Salem Abdennadher, Arani Sinha
20th IEEE Latin American Test Symposium, 2019
2019
Compressed Silicon Sensing
J Chung, Y Kim, J Lee, Y Ban, Y Kang, W Paik
The 15th Korea Test Conference, June 2014., 2014
2014
Is HSIO loopback sufficient in HVM?
K Uri, Y Kim
Design and Test Technology Conference (DTTC), Intel Corporation , Portland …, 2012
2012
I/O Challenge and Key Learning from Intel’s First Penwell SoC for Smartphone and Tablet
Y Kim
PDE Shared Learning and Networking Event, Intel Corporation, Hillsboro, OR …, 2012
2012
Atomic-scale modeling and experimental studies for dopants and defects in Si and SiGe nano-scale CMOS devices
Y Kim
2010
Atomistic kinetic Monte Carlo (KMC) modeling for self-interstitial clusters and boron-interstitial clusters in SiGe
Y Kim, T Kirichenko, N Kong, SK Banerjee
SRC TECHCON 2009, Austin, TX, USA, Sep. 14~ 15, 2009, 2009
2009
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