| Soft error sensitivity evaluation of microprocessors by multilevel emulation-based fault injection L Entrena, M Garcia-Valderas, R Fernandez-Cardenal, A Lindoso, ... IEEE Transactions on Computers 61 (3), 313-322, 2012 | 144 | 2012 |
| Analyzing the impact of single-event-induced charge sharing in complex circuits S Pagliarini, F Kastensmidt, L Entrena, A Lindoso, E San Millan IEEE Transactions on Nuclear Science 58 (6), 2768-2775, 2011 | 54 | 2011 |
| FPGAs and Parallel Architectures for Aerospace Applications F Kastensmidt, P Rech Soft Errors and Fault-Tolerant Design, 2016 | 53 | 2016 |
| High performance FPGA-based image correlation A Lindoso, L Entrena Journal of Real-Time Image Processing 2 (4), 223-233, 2007 | 47 | 2007 |
| Correlation-based fingerprint matching with orientation field alignment A Lindoso, L Entrena, J Liu-Jimenez, E San Millan International Conference on Biometrics, 713-721, 2007 | 42 | 2007 |
| A hybrid fault-tolerant LEON3 soft core processor implemented in low-end SRAM FPGA A Lindoso, L Entrena, M Garcia-Valderas, L Parra IEEE Transactions on Nuclear Science, 2016 | 41 | 2016 |
| Constrained placement methodology for reducing SER under single-event-induced charge sharing effects L Entrena, A Lindoso, E San Millan, S Pagliarini, F Almeida, ... IEEE Transactions on Nuclear Science 59 (4), 811-817, 2012 | 40 | 2012 |
| Efficient mitigation of data and control flow errors in microprocessors L Parra, A Lindoso, M Portela, L Entrena, F Restrepo-Calle, ... IEEE Transactions on Nuclear Science 61 (4), 1590-1596, 2014 | 35 | 2014 |
| Correlation-based fingerprint matching using FPGAs A Lindoso, L Entrena, C López-Ongil, J Liu Proceedings. 2005 IEEE International Conference on Field-Programmable …, 2005 | 33 | 2005 |
| Online test of control flow errors: A new debug interface-based approach B Du, MS Reorda, L Sterpone, L Parra, M Portela-García, A Lindoso, ... IEEE Transactions on Computers 65 (6), 1846-1855, 2016 | 28 | 2016 |
| A hardware-software approach for on-line soft error mitigation in interrupt-driven applications A Martínez-Álvarez, F Restrepo-Calle, S Cuenca-Asensi, LM Reyneri, ... IEEE Transactions on Dependable and Secure Computing 13 (4), 502-508, 2016 | 27 | 2016 |
| A new hybrid nonintrusive error-detection technique using dual control-flow monitoring L Parra, A Lindoso, M Portela-Garcia, L Entrena, B Du, MS Reorda, ... IEEE Transactions on Nuclear Science 61 (6), 3236-3243, 2014 | 23 | 2014 |
| Increasing security with correlation-based fingerprint matching A Lindoso, L Entrena, J Liu-Jimenez, E San Millan 2007 41st Annual IEEE International Carnahan Conference on Security …, 2007 | 23 | 2007 |
| Online Error Detection Through Trace Infrastructure in ARM Microprocessors M Peña-Fernandez, A Lindoso, L Entrena, M Garcia-Valderas, Y Morilla, ... IEEE Transactions on Nuclear Science 66 (7), 1457-1464, 2019 | 21 | 2019 |
| FPGA-based acceleration of fingerprint minutiae matching A Lindoso, L Entrena, J Izquierdo 2007 3rd southern conference on programmable logic, 81-86, 2007 | 21 | 2007 |
| Evaluation of the Suitability of NEON SIMD Microprocessor Extensions Under Proton Irradiation A Lindoso, M García-Valderas, L Entrena, Y Morilla, P Martín-Holgado IEEE Transactions on Nuclear Science 65 (8), 1835-1842, 2018 | 19 | 2018 |
| Analysis of SET effects in a PIC microprocessor for selective hardening L Entrena, A Lindoso, MG Valderas, M Portela, CL Ongil IEEE Transactions on Nuclear Science 58 (3), 1078-1085, 2011 | 18 | 2011 |
| FPGA implementation for an iris biometric processor J Liu-Jimenez, R Sanchez-Reillo, A Lindoso, O Miguel-Hurtado 2006 IEEE International Conference on Field Programmable Technology, 265-268, 2006 | 18 | 2006 |
| The Use of Microprocessor Trace Infrastructures for Radiation-Induced Fault Diagnosis M Peña-Fernandez, A Lindoso, L Entrena, M Garcia-Valderas IEEE Transactions on Nuclear Science 67 (1), 126-134, 2020 | 17 | 2020 |
| Dual-Core Lockstep enhanced with redundant multithread support and control-flow error detection M Peña-Fernández, A Serrano-Cases, A Lindoso, M García-Valderas, ... Microelectronics Reliability 100, 113447, 2019 | 17 | 2019 |
Luis EntrenaUniversidad Carlos IIIDirección de correo verificada de ing.uc3m.es
