Patrick Pons
Patrick Pons
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Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions
U Zaghloul, G Papaioannou, F Coccetti, P Pons, R Plana
Microelectronics Reliability 49 (9-11), 1309-1314, 2009
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation
M Lamhamdi, P Pons, U Zaghloul, L Boudou, F Coccetti, J Guastavino, ...
Microelectronics Reliability 48 (8-9), 1248-1252, 2008
Capabilities and limits of silicon pressure sensors
G Blazquez, P Pons, A Boukabache
Sensors and Actuators 17 (3-4), 387-403, 1989
Structure dependent charging process in RF MEMS capacitive switches
E Papandreou, M Lamhamdi, CM Skoulikidou, P Pons, G Papaioannou, ...
Microelectronics Reliability 47 (9-11), 1812-1817, 2007
Charging-effects in RF capacitive switches influence of insulating layers composition
M Lamhamdi, J Guastavino, L Boudou, Y Segui, P Pons, L Bouscayrol, ...
Microelectronics Reliability 46 (9-11), 1700-1704, 2006
Membrane supported Yagi–Uda antennae for millimetre-wave applications
D Neculoiu, P Pons, M Saadaoui, L Bary, D Vasilache, K Grenier, ...
IEE Proceedings-Microwaves, Antennas and Propagation 151 (4), 311-314, 2004
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization …
U Zaghloul, G Papaioannou, B Bhushan, F Coccetti, P Pons, R Plana
Microelectronics Reliability 51 (9-11), 1810-1818, 2011
Dielectric charging in radio frequency microelectromechanical system capacitive switches: A study of material properties and device performance
G Papaioannou, J Papapolymerou, P Pons, R Plana
Applied Physics Letters 90 (23), 233507, 2007
On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS devices
U Zaghloul, B Bhushan, P Pons, GJ Papaioannou, F Coccetti, R Plana
Nanotechnology 22 (3), 035705, 2010
Novel design of a highly sensitive RF strain transducer for passive and remote sensing in two dimensions
TT Thai, H Aubert, P Pons, G DeJean, MM Tentzeris, R Plana
IEEE Transactions on Microwave Theory and Techniques 61 (3), 1385-1396, 2013
Frequency scalable model for MEMS capacitive shunt switches at millimeter-wave frequencies
V Puyal, D Dragomirescu, C Villeneuve, J Ruan, P Pons, R Plana
IEEE Transactions on Microwave Theory and Techniques 57 (11), 2824-2833, 2009
Static response of miniature capacitive pressure sensors with square or rectangular silicon diaphragm
G Blasquez, Y Naciri, P Blondel, NB Moussa, P Pons
Revue de physique appliquée 22 (7), 505-510, 1987
Self-calibrating pressure sensor
P Pons, P Montoriol, P Yameogo
US Patent 8,622,923, 2014
A novel passive wireless ultrasensitive RF temperature transducer for remote sensing
TT Thai, JM Mehdi, H Aubert, P Pons, GR DeJean, MM Tentzeris, R Plana
2010 IEEE MTT-S International Microwave Symposium, 473-476, 2010
A wireless passive RCS-based temperature sensor using liquid metal and microfluidics technologies
A Traille, S Bouaziz, S Pinon, P Pons, H Aubert, A Boukabache, ...
2011 41st European Microwave Conference, 45-48, 2011
Design and realization of high Q millimeter-wave structures through micromachining techniques
B Guillon, D Cros, P Pons, K Grenier, T Parra, JL Cazaux, JC Lalaurie, ...
1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No. 99CH36282 …, 1999
Characterisation and modelling of the mismatch of TCRs and their effects on the drift of the offset voltage of piezoresistive pressure sensors
A Boukabache, P Pons, G Blasquez, Z Dibi
Sensors and Actuators A: Physical 84 (3), 292-296, 2000
A systematic reliability investigation of the dielectric charging process in electrostatically actuated MEMS based on Kelvin probe force microscopy
U Zaghloul, GJ Papaioannou, F Coccetti, P Pons, R Plana
Journal of Micromechanics and Microengineering 20 (6), 064016, 2010
Finite element based surface roughness study for ohmic contact of microswitches
H Liu, D Leray, S Colin, P Pons, A Broué
2012 IEEE 58th Holm conference on electrical contacts (Holm), 1-10, 2012
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques
U Zaghloul, M Koutsoureli, H Wang, F Coccetti, G Papaioannou, P Pons, ...
Microelectronics Reliability 50 (9-11), 1615-1620, 2010
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