| Midinfrared resonant magnetic nanostructures exhibiting a negative permeability S Zhang, W Fan, BK Minhas, A Frauenglass, KJ Malloy, SRJ Brueck Physical review letters 94 (3), 037402, 2005 | 429 | 2005 |
| Enhanced infrared transmission through subwavelength coaxial metallic arrays W Fan, S Zhang, B Minhas, KJ Malloy, SRJ Brueck Physical review letters 94 (3), 033902, 2005 | 274 | 2005 |
| Ellipsometric scatterometry for the metrology of sub-0.1-μm-linewidth structures BK Minhas, SA Coulombe, SSH Naqvi, JR McNeil Applied optics 37 (22), 5112-5115, 1998 | 111 | 1998 |
| The effects of an electromagnetic crystal substrate on a microstrip patch antenna K Agi, M Mojahedi, B Minhas, E Schamiloglu, KJ Malloy IEEE transactions on Antennas and Propagation 50 (4), 451-456, 2002 | 63 | 2002 |
| Scatterometry measurement of sub-0.1 μm linewidth gratings SA Coulombe, BK Minhas, CJ Raymond, S Sohail H. Naqvi, JR McNeil Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1998 | 56 | 1998 |
| Metallic inductive and capacitive grids: theory and experiment BK Minhas, W Fan, K Agi, SRJ Brueck, KJ Malloy JOSA A 19 (7), 1352-1359, 2002 | 50 | 2002 |
| Identity of the cross-reflection coefficients for symmetric surface-relief gratings PC Logofătu, SA Coulombe, BK Minhas, JR McNeil josa a 16 (5), 1108-1114, 1999 | 42 | 1999 |
| Ellipsometric scatterometry for sub-0.1-um CD measurements SA Coulombe, PC Logofatu, BK Minhas, SSH Naqvi, JR McNeil Metrology, Inspection, and Process Control for Microlithography XII 3332 …, 1998 | 40 | 1998 |
| Toward sub-0.1-um CD measurements using scatterometry BK Minhas, SL Prins, SSH Naqvi, JR McNeil Metrology, Inspection, and Process Control for Microlithography X 2725, 729-739, 1996 | 28 | 1996 |
| Deeply etched grating structures for enhanced absorption in thin c-Si solar cells SH Zaidi, R Marquadt, B Minhas, JW Tringe Conference Record of the Twenty-Ninth IEEE Photovoltaic Specialists …, 2002 | 22 | 2002 |
| High gain and wide-band aperture-coupled microstrip patch antenna with mounted horn integrated on FR4 for 60 GHz communication systems WT Sethi, H Vettikalladi, BK Minhas, MA Alkanhal 2013 IEEE Symposium on Wireless Technology & Applications (ISWTA), 359-362, 2013 | 16 | 2013 |
| Fabrication of 1D and 2D vertical nanomagnetic resonators S Zhang, W Fan, BK Minhas, A Frauenglass, KJ Malloy, SRJ Brueck Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2004 | 7 | 2004 |
| Over 80% subwavelength transmission in annular coaxial metallic arrays W Fan, S Zhang, B Minhas, KJ Malloy, SRJ Brueck InternationalQuantum Electronics Conference, 2004.(IQEC)., 1156-1157, 2004 | 1 | 2004 |
| Massively parallel solution of the inverse scattering problem for integrated circuit quality control RW Leland, BL Draper, S Naqvi, B Minhas Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 1997 | 1 | 1997 |
| Study of the convergence behavior of the vectorial modal method for metallic lamellar gratings BK Minhas Modeling Aspects in Optical Metrology III 8083, 128-136, 2011 | | 2011 |
| Papers from the 48th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication-Nanomagnetics and Nanophotonics-Fabrication of 1D and 2D vertical … S Zhang, W Fan, BK Minhas, A Frauenglass, KJ Malloy, SRJ Brueck Journal of Vacuum Science and Technology-Section B 22 (6), 3327-3330, 2004 | | 2004 |
| Numerical modeling of periodic structures: Metallic grids and metamaterials BK Minhas The University of New Mexico, 2003 | | 2003 |
| Interferometric Lithography for Infrared Two-Dimensional Photonic Crystals W Fan, B Minhas Proceedings of the International Instrumentation Symposium 45, 185-190, 1999 | | 1999 |
| DIFFRACTIVE OPTICS AND MICRO-OPTICS: MODELING, DESIGN, FABRICATION, AND APPLICATIONS-Grating Analysis-Identity of the cross-reflection coefficients for symmetric surface-relief … PC Logofatu, SA Coulombe, BK Minhas, JR McNeil Journal of the Optical Society of America-A-Optics Image Science and Vision …, 1999 | | 1999 |
| Ellipsometric-Scatterometry for sub-0.1 m CD measurements [3332-31] SA Coulombe, PC Logofatu, BK Minhas, S Sohail, H Naqvi, JR McNeil PROCEEDINGS-SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 282-295, 1998 | | 1998 |
