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Kuldeep Shah
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Cited by
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Improved metrology of implant lines on static images of textured silicon wafers using line integral method
K Shah, E Saber, K Verrier
Image Processing: Machine Vision Applications VIII 9405, 102-111, 2015
2015
Image enhancement for low resolution display panels
RS Kothari, E Saber, M Nelson, M Stauffer, D Bohan, K Shah
Color Imaging XX: Displaying, Processing, Hardcopy, and Applications 9395, 77-85, 2015
2015
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Articles 1–2