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Co-authors
Eli Saber
Professor of Electrical and Microelectronic Engineering, RIT
Verified email at rit.edu
Rakshit Kothari
Color Scientist at Apple
Verified email at rit.edu
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Kuldeep Shah
Rochester Institute of Technology
Verified email at g.rit.edu
computer vision
machine learning
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Improved metrology of implant lines on static images of textured silicon wafers using line integral method
K Shah, E Saber, K Verrier
Image Processing: Machine Vision Applications VIII 9405, 102-111
, 2015
2015
Image enhancement for low resolution display panels
RS Kothari, E Saber, M Nelson, M Stauffer, D Bohan, K Shah
Color Imaging XX: Displaying, Processing, Hardcopy, and Applications 9395, 77-85
, 2015
2015
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