A 32-Gb/s PAM4-Binary Bridge With Sampler Offset Cancellation for Memory Testing D Yun, E Lee, W Jung, K Kim, KM Beak, J Kim, HB Lee, B Ko, WS Choi, ... IEEE Transactions on Circuits and Systems II: Express Briefs 69 (9), 3749-3753, 2022 | 4 | 2022 |
An 8-GHz Octa-Phase Error Corrector With Coprime Phase Comparison Scheme in 40-nm CMOS JW Sull, S Shin, J Oh, KH Lee, J Kim, JH Park, DK Jeong IEEE Transactions on Circuits and Systems II: Express Briefs 69 (3), 874-878, 2021 | 2 | 2021 |
A 10Gb/s/pin DQS and WCK built-out tester for LPDDR5 DRAM test CH Kye, J Kim, K Baek, K Kim, S Pack, C Jung, DK Jeong 2022 IEEE Asian Solid-State Circuits Conference (A-SSCC), 6-8, 2022 | 1 | 2022 |